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SungGeun Kim
Researcher
PaperEffects of Interface Roughness Scattering on Radio Frequency Performance of Silicon Nanowire TransistorsAuthorship / preprint / 2011PaperFull 3D Quantum Transport Simulation of Atomistic Interface Roughness in Silicon Nanowire FETsAuthorship / preprint / 2011PaperEngineering Nanowire n-MOSFETs at Lg < 8 nmAuthorship / preprint / 2013PaperOptimum High-k Oxide for the Best Performance of Ultra-scaled Double-Gate MOSFETsAuthorship / preprint / 2015