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Sibylle Sievers
Researcher
PaperTowards wafer scale inductive determination of magnetostatic and dynamic parameters of magnetic thin films and multilayersAuthorship / preprint / 2013PaperA Ti/Pt/Co multilayer stack for transfer function based magnetic force microscopy calibrationsAuthorship / preprint / 2022PaperQuantitative measurement of the magnetic moment of an individual magnetic nanoparticle by magnetic force microscopyAuthorship / preprint / 2010PaperBroadband ferromagnetic resonance characterization of GaMnAs thin filmsAuthorship / preprint / 2013PaperQuantum calibrated magnetic force microscopyAuthorship / preprint / 2021PaperUncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force MicroscopyAuthorship / preprint / 2020PaperOn the influence of reference sample properties on magnetic force microscopy calibrationsAuthorship / preprint / 2026PaperThermoelectric signature of individual skyrmionsAuthorship / preprint / 2020