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Serge Biesemans
Researcher
PaperInterface Trap Density Metrology of state-of-the-art undoped Si n-FinFETsAuthorship / preprint / 2010PaperInterface trap density metrology from sub-threshold transport in highly scaled undoped Si n-FinFETsAuthorship / preprint / 2011PaperThermionic Emission as a tool to study transport in undoped nFinFETsAuthorship / preprint / 2010