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Robert Klanner
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Robert Klanner13 visible / 13 total nodes / 12 links

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AuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipAuthorshipRobert KlannerARobert KlannerResearcherChallenges for Silicon Pixel Sensors at the European XFELWChallenges for Silicon ...preprint / 2012Influence of X-ray Irradiation on the Properties of the Hamamatsu Silicon Photomultiplier S10362-11-050CWInfluence of X-ray Irra...preprint / 2014Measurement of the drift velocities of electrons and holes in high-ohmic <100> siliconWMeasurement of the drif...preprint / 2015Determination of the electronics transfer function for current transient measurementsWDetermination of the el...preprint / 2014Measurements of charge carrier mobilities and drift velocity saturation in bulk silicon of <111> and <100> crystal orientation at high electric fieldsWMeasurements of charge ...preprint / 2010Charge losses in segmented silicon sensors at the Si-SiO2 interfaceWCharge losses in segmen...preprint / 2012Time dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensorsWTime dependence of char...preprint / 2013Study of X-ray Radiation Damage in Silicon SensorsWStudy of X-ray Radiatio...preprint / 2011Investigation of X-ray induced radiation damage at the Si-SiO2 interface of silicon sensors for the European XFELWInvestigation of X-ray ...preprint / 2012Design and First Tests of a Radiation-Hard Pixel Sensor for the European X-Ray Free-Electron LaserWDesign and First Tests ...preprint / 2014Simulation and Experimental Study of Plasma Effects in Planar Silicon SensorsWSimulation and Experime...preprint / 2010Study of radiation damage induced by 12 keV X-rays in MOS structures built on high resistivity n-type siliconWStudy of radiation dama...preprint / 2012
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Robert Klanner

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PaperChallenges for Silicon Pixel Sensors at the European XFELAuthorship / preprint / 2012PaperInfluence of X-ray Irradiation on the Properties of the Hamamatsu Silicon Photomultiplier S10362-11-050CAuthorship / preprint / 2014PaperMeasurement of the drift velocities of electrons and holes in high-ohmic <100> siliconAuthorship / preprint / 2015PaperDetermination of the electronics transfer function for current transient measurementsAuthorship / preprint / 2014PaperMeasurements of charge carrier mobilities and drift velocity saturation in bulk silicon of <111> and <100> crystal orientation at high electric fieldsAuthorship / preprint / 2010PaperCharge losses in segmented silicon sensors at the Si-SiO2 interfaceAuthorship / preprint / 2012PaperTime dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensorsAuthorship / preprint / 2013PaperStudy of X-ray Radiation Damage in Silicon SensorsAuthorship / preprint / 2011

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