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Joern Schwandt
Researcher
PaperDesign and First Tests of a Radiation-Hard Pixel Sensor for the European X-Ray Free-Electron LaserAuthorship / preprint / 2014PaperTime dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensorsAuthorship / preprint / 2013PaperInvestigation of X-ray induced radiation damage at the Si-SiO2 interface of silicon sensors for the European XFELAuthorship / preprint / 2012PaperStudy of radiation damage induced by 12 keV X-rays in MOS structures built on high resistivity n-type siliconAuthorship / preprint / 2012PaperStudy of X-ray radiation damage in the AGIPD sensor for the European XFELAuthorship / preprint / 2013PaperStudy of X-ray Radiation Damage in Silicon SensorsAuthorship / preprint / 2011