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D. Vernani
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D. Vernani3 visible / 3 total nodes / 2 links

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AuthorshipAuthorshipD. VernaniAD. VernaniResearcherCharacterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM resultsWCharacterization of mul...preprint / 2015Angular resolution measurements at SPring-8 of a hard X-ray optic for the New Hard X-ray MissionWAngular resolution meas...preprint / 2015
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D. Vernani

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PaperCharacterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM resultsAuthorship / preprint / 2015PaperAngular resolution measurements at SPring-8 of a hard X-ray optic for the New Hard X-ray MissionAuthorship / preprint / 2015

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