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C. Biasotto
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C. Biasotto2 visible / 2 total nodes / 1 links

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AuthorshipC. BiasottoAC. BiasottoResearcherStrain determination in the Si channel above a single SiGe island inside a field effect transistor using nanobeam x-ray diffractionWStrain determination in...preprint / 2010
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C. Biasotto

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PaperStrain determination in the Si channel above a single SiGe island inside a field effect transistor using nanobeam x-ray diffractionAuthorship / preprint / 2010

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