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Researcher profile

Zainalabedin Navabi

Zainalabedin Navabi contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
Hardware ArchitectureLogic in Computer Science

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2 published item(s)

preprint2022arXiv

Testable Array Multipliers for a Better Utilization of C-Testability and Bijectivity

This paper presents a design for test (DFT)architecture for fast and scalable testing of array multipliers (MULTs). Regardless of the MULT size, our proposed testable architecture, without major changes in the original architecture, requires only five test vectors. Test pattern generation (TPG) is done by combining C-testability, bijectivity and deterministic TPG methods. Experimental results show 100% fault coverage for single stuck-at faults. The proposed method requires minor testability hardware insertion into the multiplier with extra delay and area overhead of less than 0.5% for a 64-bit multiplier.

0 citations0 reviewsNo code linkedOpen access
preprint2007arXiv

Simultaneous Reduction of Dynamic and Static Power in Scan Structures

Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in future technologies the static portion of power dissipation will outreach the dynamic portion. This paper proposes an efficient technique to reduce both dynamic and static power dissipation in scan structures. Scan cell outputs which are not on the critical path(s) are multiplexed to fixed values during scan mode. These constant values and primary inputs are selected such that the transitions occurred on non-multiplexed scan cells are suppressed and the leakage current during scan mode is decreased. A method for finding these vectors is also proposed. Effectiveness of this technique is proved by experiments performed on ISCAS89 benchmark circuits.

0 citations0 reviewsNo code linkedOpen access