Source author record

Yong S. Chu

Yong S. Chu appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
3topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2024arXiv

Coordinate-based Neural Network for Fourier Phase Retrieval

Fourier phase retrieval is essential for high-definition imaging of nanoscale structures across diverse fields, notably coherent diffraction imaging. This study presents the Single impliCit neurAl Network (SCAN), a tool built upon coordinate neural networks meticulously designed for enhanced phase retrieval performance. Remedying the drawbacks of conventional iterative methods which are easiliy trapped into local minimum solutions and sensitive to noise, SCAN adeptly connects object coordinates to their amplitude and phase within a unified network in an unsupervised manner. While many existing methods primarily use Fourier magnitude in their loss function, our approach incorporates both the predicted magnitude and phase, enhancing retrieval accuracy. Comprehensive tests validate SCAN's superiority over traditional and other deep learning models regarding accuracy and noise robustness. We also demonstrate that SCAN excels in the ptychography setting.

preprint2020arXiv

Complete Strain Mapping of Nanosheets of Tantalum Disulfide

Quasi-two-dimensional (quasi-2D) materials hold promise for future electronics because of their unique band structures that result in electronic and mechanical properties sensitive to crystal strains in all three dimensions. Quantifying crystal strain is a prerequisite to correlating it with the performance of the device, and calls for high resolution but spatially resolved rapid characterization methods. Here we show that using fly-scan nano X-ray diffraction we can accomplish a tensile strain sensitivity below 0.001% with a spatial resolution of better than 80 nm over a spatial extent of 100 $μ$m on quasi 2D flakes of 1T-TaS2. Coherent diffraction patterns were collected from a $\sim$ 100 nm thick sheet of 1T-TaS2 by scanning 12keV focused X-ray beam across and rotating the sample. We demonstrate that the strain distribution around micron and sub-micron sized 'bubbles' that are present in the sample may be reconstructed from these images. The experiments use state of the art synchrotron instrumentation, and will allow rapid and non-intrusive strain mapping of thin film samples and electronic devices based on quasi 2D materials.