Source author record

Wilfrid Poirier

Explore this author’s publications, collaborators and research topics. This catalog record has not been claimed by its author.

ResearcherUnclaimed source record

Catalog footprint

Research overview

2works
2topics
4close collaborators

Published work

2 publications

preprint2020arXiv

Quantitative measurement of the thermal contact resistance between a glass microsphere and a plate

Accurate measurements of the thermal resistance between micro-objects made of insulating materials are complex because of their small size, low conductivity, and the presence of various ill-defined gaps. We address this issue using a modified scanning thermal microscope operating in vacuum and in air. The sphere-plate geometry is considered. Under controlled heating power, we measure the temperature on top of a glass microsphere glued to the probe as it approaches a glass plate at room temperature with nanometer accuracy. In vacuum, a jump is observed at contact. From this jump in temperature and the modeling of the thermal resistance of a sphere, the sphere-plate contact resistance RK=(1.4±0.18)×107 K.W−1 R_K=(1.4 \pm 0.18)\times10^7 \ \mathrm{K.W^{-1}} and effective radius r=(36±4)r=(36 \pm 4) nm are obtained. In air, the temperature on top of the sphere shows a decrease starting from a sphere-plate distance of 200 μm\mathrm{μm}. A jump is also observed at contact, with a reduced amplitude. The sphere-plate coupling out of contact can be described by the resistance shape factor of a sphere in front of a plate in air, placed in a circuit involving a series and a parallel resistance that are determined by fitting the approach curve. The contact resistance in air RK∗=(1.2±0.46)×107 K.W−1R^*_K=(1.2 \pm 0.46)\times 10^7 \ \mathrm{K.W^{-1}} is then estimated from the temperature jump. The method is quantitative without requiring any tedious multiple-scale numerical simulation, and is versatile to describe the coupling between micro-objects from large distances to contact in various environments.

preprint2013arXiv

Quantum resistance standard accuracy close to the zero-dissipation state

We report on a comparison of four GaAs/AlGaAs-based quantum resistance standards using an original technique adapted from the well-known Wheatstone bridge. This work shows that the quantized Hall resistance at Landau level filling factor ν=2ν=2 can be reproducible with a relative uncertainty of 32×10−1232\times 10^{-12} in the dissipationless limit of the quantum Hall effect regime. In the presence of a very small dissipation characterized by a mean macroscopic longitudinal resistivity Rxx(B)ˉ\bar{R_{xx}(B)} of a few μΩμΩ, the discrepancy ΔRH(B)ΔR_{\mathrm{H}}(B) measured on the Hall plateau between quantum Hall resistors turns out to follow the so-called resistivity rule Rxx(B)ˉ=αB×d(ΔRH(B))/dB\bar{R_{xx}(B)}=αB\times d(ΔR_{\mathrm{H}}(B))/dB. While the dissipation increases with the measurement current value, the coefficient αα stays constant in the range investigated (40−120μA40-120 \mathrm{μA}). This result enlightens the impact of the dissipation emergence in the two-dimensional electron gas on the Hall resistance quantization, which is of major interest for the resistance metrology. The quantum Hall effect is used to realize a universal resistance standard only linked to the electron charge \emph{e} and the Planck's constant \emph{h} and it is known to play a central role in the upcoming revised \emph{Système International} of units. There are therefore fundamental and practical benefits in testing the reproducibility property of the quantum Hall effect with better and better accuracy.

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.