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Researcher profile

W. H. Rippard

W. H. Rippard contributes to research discovery and scholarly infrastructure.

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cond-mat.mes-hallcond-mat.mtrl-scicond-mat.other

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Published work

3 published item(s)

preprint2012arXiv

Switching Distributions for Perpendicular Spin-Torque Devices within the Macrospin Approximation

We model "soft" error rates for writing (WSER) and for reading (RSER) for perpendicular spin-torque memory devices by solving the Fokker-Planck equation for the probability distribution of the angle that the free layer magnetization makes with the normal to the plane of the film. We obtain: (1) an exact, closed form, analytical expression for the zero-temperature switching time as a function of initial angle; (2) an approximate analytical expression for the exponential decay of the WSER as a function of the time the current is applied; (3) comparison of the approximate analytical expression for the WSER to numerical solutions of the Fokker-Planck equation; (4) an approximate analytical expression for the linear increase in RSER with current applied for reading; (5) comparison of the approximate analytical formula for the RSER to the numerical solution of the Fokker-Planck equation; and (6) confirmation of the accuracy of the Fokker-Planck solutions by comparison with results of direct simulation using the single-macrospin Landau-Lifshitz-Gilbert (LLG) equations with a random fluctuating field in the short-time regime for which the latter is practical.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Non-white frequency noise in spin torque oscillators and its effect on spectral linewidth

We measure the power spectral density of frequency fluctuations in nanocontact spin torque oscillators over time scales up to 50 ms. We use a mixer to convert oscillator signals ranging from 10 GHz to 40 GHz into a band near 70 MHz before digitizing the time domain waveform. We analyze the waveform using both zero crossing time stamps and a sliding Fourier transform, discuss the different limitations and advantages of these two methods, and combine them to obtain a frequency noise spectrum spanning more than five decades of Fourier frequency $f$. For devices having a free layer consisting of either a single Ni$_{\text{}80}$Fe$_{\text{}20}$ layer or a Co/Ni multilayer we find a frequency noise spectrum that is white at large $f$ and varies as \emph{$1/f$} at small $f$. The crossover frequency ranges from $\approx\unit[10^{4}]{Hz}$ to $\approx\unit[10^{6}]{Hz}$ and the $1/f$ component is stronger in the multilayer devices. Through actual and simulated spectrum analyzer measurements, we show that $1/f$ frequency noise causes both broadening and a change in shape of the oscillator's spectral line as measurement time increases. Our results indicate that the long term stability of spin torque oscillators cannot be accurately predicted from models based on thermal (white) noise sources.

0 citations0 reviewsNo code linkedOpen access
preprint2009arXiv

Time domain measurement of phase noise in a spin torque oscillator

We measure oscillator phase from the zero crossings of the voltage vs. time waveform of a spin torque nanocontact oscillating in a vortex mode. The power spectrum of the phase noise varies with Fourier frequency $f$ as $1/f^2$, consistent with frequency fluctuations driven by a thermal source. The linewidth implied by phase noise alone is about 70 % of that measured using a spectrum analyzer. A phase-locked loop reduces the phase noise for frequencies within its 3 MHz bandwidth.

0 citations0 reviewsNo code linkedOpen access