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Researcher profile

W. Eikmann

W. Eikmann contributes to research discovery and scholarly infrastructure.

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astro-ph.HE

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Published work

4 published item(s)

preprint2016arXiv

Normalizing a Relativistic Model of X-ray Reflection: The Definition of the Reflection Fraction and its Implementation in relxill

The only relativistic reflection model that implements a parameter relating the intensity incident on an accretion disk to the observed intensity is relxill. The parameter used in earlier versions of this model, referred to as the reflection strength, is unsatisfactory, and it has been superseded by a parameter that provides insight into the accretion geometry, namely the reflection fraction. The reflection fraction is defined as the ratio of the coronal intensity illuminating the disk to the coronal intensity that reaches the observer. The relxill model combines a general relativistic ray-tracing code and a photoionization code to compute the component of radiation reflected from an accretion that is illuminated by an internal source. The reflection fraction is a particularly important parameter for relativistic models with well-defined geometry, such as the lamppost model, which is a focus of this paper. Relativistic spectra are compared for three inclinations and for four values of the key parameter of the lamppost model, namely the height above the black hole of the illuminating, on-axis point source. In all cases, the strongest reflection is produced for low source heights and high spin. A low-spin black hole is shown to be incapable of producing enhanced relativistic reflection. Results for the relxill model are compared to those obtained with other models and a Monte Carlo simulation. Fitting data using the relxill model and the recently implemented parameter the reflection fraction, one can constrain the geometry of a system, under the assumption of a lamppost-like accretion geometry. The reflection fraction is independent of such system parameters as inclination and black hole spin. The reflection fraction parameter was implemented with the name refl_frac in all flavors of the relxill model, and the nonrelativistic reflection model xillver, in v0.4a (18 January 2016).

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preprint2015arXiv

An XMM-Newton view of FeKα in HMXBs

We present a comprehensive analysis of the whole sample of available XMM-Newton observations of High Mass X-ray Binaries (HMXBs) until August, 2013, focusing on the FeKα emission line. This line is a key tool to better understand the physical properties of the material surrounding the X-ray source within a few stellar radii (the circumstellar medium). We have collected observations from 46 HMXBs, detecting FeKα in 21 of them. We have used the standard classification of HMXBs to divide the sample in different groups. We find that: (1) FeKα is centred at a mean value of 6.42 keV. Considering the instrumental and fits uncertainties, this value is compatible with ionization states lower than FeXVIII. (2) The flux of the continuum is well correlated with the flux of the line, as expected. Eclipse observations show that the Fe fluorescence emission comes from an extended region surrounding the X-ray source. (3) FeKα is narrow (width lower than 0.15keV), reflecting that the reprocessing material does not move at high speeds. We attempt to explain the broadness of the line in terms of three possible broadening phenomena: line blending, Compton scattering and Doppler shifts (with velocities of the reprocessing material V=1000-2000 km/s). (4) The equivalent hydrogen column (NH) directly correlates with the EW of FeKα, displaying clear similarities to numerical simulations. It highlights the strong link between the absorbing and the fluorescent matter. The obtained results clearly point to a very important contribution of the donors wind in the FeKα emission and the absorption when the donor is a supergiant massive star.

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preprint2013arXiv

Improved Reflection Models of Black-Hole Accretion Disks: Treating the Angular Distribution of X-rays

X-ray reflection models are used to constrain the properties of the accretion disk, such as the degree of ionization of the gas and the elemental abundances. In combination with general relativistic ray tracing codes, additional parameters like the spin of the black hole and the inclination to the system can be determined. However, current reflection models used for such studies only provide angle-averaged solutions for the flux reflected at the surface of the disk. Moreover, the emission angle of the photons changes over the disk due to relativistic light bending. To overcome this simplification, we have constructed the new angle-dependent reflection model RELXILL, by self-consistently connecting the XILLVER reflection models with the relativistic blurring code RELLINE.

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preprint2013arXiv

X-ray reflected spectra from accretion disk models. III. A complete grid of ionized reflection calculations

We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code XILLVER that incorporates new routines and a richer atomic data base. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index Γof the illuminating radiation, the ionization parameter ξat the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A_{Fe} relative to the solar value. The ranges of the parameters covered are: 1.2 \leq Γ\leq 3.4, 1 \leq ξ\leq 10^4, and 0.5 \leq A_{Fe} \leq 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file{\url{http://hea-www.cfa.harvard.edu/~javier/xillver/}} suitable for the analysis of X-ray observations via the atable model in XSPEC. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of XILLVER.

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