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Valentin Munteanu

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2 published item(s)

preprint2022arXiv

Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect, experimental errors and feature engineering

This work demonstrates the Python package mlreflect which implements an optimized pipeline for the automized analysis of reflectometry data using machine learning. The package combines several training and data treatment techniques discussed in previous publications. The predictions made by the neural network are accurate and robust enough to serve as good starting parameters for an optional subsequent least mean squares (LMS) fit of the data. It is shown that for a large dataset of 242 reflectivity curves of various thin films on silicon substrates, the pipeline reliably finds an LMS minimum very close to a fit produced by a human researcher with the application of physical knowledge and carefully chosen boundary conditions. Furthermore, the differences between simulated and experimental data and their implications for the training and performance of neural networks are discussed. The experimental test set is used to determine the optimal noise level during training. Furthermore, the extremely fast prediction times of the neural network are leveraged to compensate for systematic errors by sampling slight variations of the data.

preprint2022arXiv

Tracking perovskite crystallization via deep learning-based feature detection on 2D X-ray scattering data

Understanding the processes of perovskite crystallization is essential for improving the properties of organic solar cells. In situ real-time grazing-incidence X-ray diffraction (GIXD) is a key technique for this task, but it produces large amounts of data, frequently exceeding the capabilities of traditional data processing methods. We propose an automated pipeline for the analysis of GIXD images, based on the Faster R-CNN deep learning architecture for object detection, modified to conform to the specifics of the scattering data. The model exhibits high accuracy in detecting diffraction features on noisy patterns with various experimental artifacts. We demonstrate our method on real-time tracking of organic-inorganic perovskite structure crystallization and test it on two applications: 1. the automated phase identification and unit-cell determination of two coexisting phases of Ruddlesden-Popper 2D perovskites, and 2. the fast tracking of MAPbI$_3$ perovskite formation. By design, our approach is equally suitable for other crystalline thin-film materials.