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Source author record

V. P. Ovsyannikov

V. P. Ovsyannikov appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.atom-phphysics.plasm-phphysics.acc-ph

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Published work

4 published item(s)

preprint2015arXiv

Main magnetic focus ion source with the radial extraction of ions

In the main magnetic focus ion source, atomic ions are produced in the local ion trap created by the rippled electron beam in focusing magnetic field. Here we present the novel modification of the room-temperature hand-size device, which allows the extraction of ions in the radial direction perpendicular to the electron beam across the magnetic field. The detected X-ray emission evidences the production of Ir$^{44+}$ and Ar$^{16+}$ ions. The ion source can operate as the ion trap for X-ray spectroscopy, as the ion source for the production of highly charged ions and also as the ion source of high brightness.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Main Magnetic Focus Ion Source: I. Basic principles and theoretical predictions

It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, the extremely high electron current densities can be attained on short length of the ion trap. The design the very compact ion sources is feasible. For such ions as, for example, Ne${}^{8+}$ and Xe${}^{44+}$, the intensities of about $10^9$ and $10^6$ particles per second, respectively, can be obtained.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Main Magnetic Focus Ion Source: II. The first investigations at 10 keV

The basic principles of design for the compact ion source of new generation are presented. The device uses the local ion trap created by the axial electron beam rippled in a thick magnetic lens. In accordance with this feature, the ion source is given the name main magnetic focus ion source. The experimental evidences for the production of Ir$^{59+}$, Xe$^{44+}$, and Ar$^{16+}$ ions are obtained. The control over depth of the local ion trap is shown to be feasible.

0 citations0 reviewsNo code linkedOpen access
preprint2014arXiv

Main Magnetic Focus Ion Trap, new tool for trapping of highly charged ions

It is proposed to produce the highly charged ions in the local ion trap formed by a rippling electron beam in the focusing magnetic field. The experimental results demonstrate the presence of iridium ions with charges up to 50+. According to estimates, the average electron current density in the local ion trap can reach the value of the order of 10 kA/cm^2. The pilot examples of devices of this type with the electron beam energies within the range 3-10 keV are also presented.

0 citations0 reviewsNo code linkedOpen access