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Researcher profile

V. Cotroneo

V. Cotroneo contributes to research discovery and scholarly infrastructure.

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astro-ph.IMastro-ph.HE

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Published work

5 published item(s)

preprint2022arXiv

First light of BEaTriX, the new testing facility for the modular X-ray optics of the ATHENA mission

The Beam Expander Testing X-ray facility (BEaTriX) is a unique X-ray apparatus now operated at the Istituto Nazionale di Astrofisica (INAF), Osservatorio Astronomico di Brera (OAB), in Merate, Italy. It has been specifically designed to measure the point spread function (PSF) and the effective area (EA) of the X-ray mirror modules (MMs) of the Advanced Telescope for High-ENergy Astrophysics (ATHENA), based on silicon pore optics (SPO) technology, for verification before integration into the mirror assembly. To this end, BEaTriX generates a broad, uniform, monochromatic, and collimated X-ray beam at 4.51 keV. [...] In BEaTriX, a micro-focus X-ray source with a titanium anode is placed in the focus of a paraboloidal mirror, which generates a parallel beam. A crystal monochromator selects the 4.51 keV line, which is expanded to the final size by a crystal asymmetrically cut with respect to the crystalline planes. [...] After characterization, the BEaTriX beam has the nominal dimensions of 170 mm x 60 mm, with a vertical divergence of 1.65 arcsec and a horizontal divergence varying between 2.7 and 3.45 arcsec, depending on the monochromator setting: either high collimation or high intensity. The flux per area unit varies from 10 to 50 photons/s/cm2 from one configuration to the other. The BEaTriX beam performance was tested using an SPO MM, whose entrance pupil was fully illuminated by the expanded beam, and its focus was directly imaged onto the camera. The first light test returned a PSF and an EA in full agreement with expectations. As of today, the 4.51 keV beamline of BEaTriX is operational and can characterize modular X-ray optics, measuring their PSF and EA with a typical exposure of 30 minutes. [...] We expect BEaTriX to be a crucial facility for the functional test of modular X-ray optics, such as the SPO MMs for ATHENA.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Angular resolution measurements at SPring-8 of a hard X-ray optic for the New Hard X-ray Mission

The realization of X-ray telescopes with imaging capabilities in the hard (> 10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg) grazing angles to enhance the reflectivity of reflective coatings. On the other hand, to obtain large collecting area, large mirror diameters (< 350 mm) are necessary. This implies that mirrors with focal lengths >10 m shall be produced and tested. Full-illumination tests of such mirrors are usually performed with on- ground X-ray facilities, aimed at measuring their effective area and the angular resolution; however, they in general suffer from effects of the finite distance of the X-ray source, e.g. a loss of effective area for double reflection. These effects increase with the focal length of the mirror under test; hence a &#34;partial&#34; full-illumination measurement might not be fully representative of the in-flight performances. Indeed, a pencil beam test can be adopted to overcome this shortcoming, because a sector at a time is exposed to the X-ray flux, and the compensation of the beam divergence is achieved by tilting the optic. In this work we present the result of a hard X-ray test campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation facility, aimed at characterizing the Point Spread Function (PSF) of a multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming. The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope (0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV, and compare them with the PSFs computed from post-campaign metrology data, self-consistently treating profile and roughness data by means of a method based on the Fresnel diffraction theory. The modeling matches the measured PSFs accurately.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results

Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the reflective coatings. In order to evaluate the achievable optical performance X-Ray Reflectivity (XRR) measurements are performed, which are powerful tools for the in-depth characterization of multilayer properties (roughness, thickness and density distribution). An exact extraction of the stack parameters is however difficult because the XRR scans depend on them in a complex way. The PPM code, developed at ERSF in the past years, is able to derive the layer-by-layer properties of multilayer structures from semi-automatic XRR scan fittings by means of a global minimization procedure in the parameters space. In this work we will present the PPM modeling of some multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation. Moreover, in order to verify the predictions of PPM, the obtained results are compared with TEM profiles taken on the same set of samples. As we will show, PPM results are in good agreement with the TEM findings. In addition, we show that the accurate fitting returns a physically correct evaluation of the variation of layers thickness through the stack, whereas the thickness trend derived from TEM profiles can be altered by the superposition of roughness profiles in the sample image.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Computation of the off-axis effective area of the New Hard X-ray Mission modules by means of an analytical approach

One of the most important parameters determining the sensitivity of X-ray telescopes is their effective area as a function of the X-ray energy. The computation of the effective area of a Wolter-I mirror, with either a single layer or multilayer coating, is a very simple task for a source on-axis at astronomical distance. Indeed, when the source moves off-axis the calculation is more complicated, in particular for new hard X-ray imaging telescopes (NuSTAR, ASTRO-H, NHXM, IXO) beyond 10 keV, that will make use of multilayer coatings to extend the reflectivity band in grazing incidence. Unlike traditional single-layer coatings (in Ir or Au), graded multilayer coatings exhibit an oscillating reflectivity as a function of the incidence angle, which makes the effective area not immediately predictable for a source placed off-axis within the field of view. For this reason, the computation of the off-axis effective area has been so far demanded to ray- tracing codes, able to sample the incidence of photons onto the mirror assembly. Even if this approach should not be disdained, it would be interesting to approach the same problem from an analytical viewpoint. This would speed up and simplify the computation of the effective area as a function of the off-axis angle, a considerable advantage especially whenever the mirror parameters are still to be optimized. In this work we present the application of a novel, analytical formalism to the computation of the off-axis effective area and the grasp of the NHXM optical modules, requiring only the standard routines for the multilayer reflectivity computation.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

A wide field X-ray telescope for astronomical survey purposes: from theory to practice

X-ray mirrors are usually built in the Wolter I (paraboloid-hyperboloid) configuration. This design exhibits no spherical aberration on-axis but suffers from field curvature, coma and astigmatism, therefore the angular resolution degrades rapidly with increasing off-axis angles. Different mirror designs exist in which the primary and secondary mirror profiles are expanded as a power series in order to increase the angular resolution at large off-axis positions, at the expanses of the on-axis performances. Here we present the design and global trade off study of an X-ray mirror systems based on polynomial optics in view of the Wide Field X-ray Telescope (WFXT) mission. WFXT aims at performing an extended cosmological survey in the soft X-ray band with unprecedented flux sensitivity. To achieve these goals the angular resolution required for the mission is very demanding ~5 arcsec mean resolution across a 1-deg field of view. In addition an effective area of 5-9000 cm^2 at 1 keV is needed.

0 citations0 reviewsNo code linkedOpen access