Researcher profile

V. Antonov

V. Antonov contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2015arXiv

Disorder induced Dirac-point physics in epitaxial graphene from temperature-dependent magneto-transport measurements

We report a study of disorder effects on epitaxial graphene in the vicinity of the Dirac point by magneto-transport. Hall effect measurements show that the carrier density increases quadratically with temperature, in good agreement with theoretical predictions which take into account intrinsic thermal excitation combined with electron-hole puddles induced by charged impurities. We deduce disorder strengths in the range 10.2 $\sim$ 31.2 meV, depending on the sample treatment. We investigate the scattering mechanisms and estimate the impurity density to be $3.0 \sim 9.1 \times 10^{10}$ cm$^{-2}$ for our samples. An asymmetry in the electron/hole scattering is observed and is consistent with theoretical calculations for graphene on SiC substrates. We also show that the minimum conductivity increases with increasing disorder potential, in good agreement with quantum-mechanical numerical calculations.

preprint2013arXiv

Evidence for interacting two-level systems from the 1/f noise of a superconducting resonator

Here we find the increase in 1/f noise of superconducting resonators at low temperatures to be completely incompatible with the standard tunneling model (STM) of Two Level Systems (TLS), which has been used to describe low-frequency noise for over three decades. We revise the STM to include a significant TLS - TLS interaction. The new model is able to explain the temperature and power dependence of noise in our measurements, as well as recent studies of individual TLS lifetimes using superconducting qubits. The measurements were made possible by implementing an ultra-stable frequency-tracking technique used in atomic clocks and by producing a superconducting resonator insensitive to temperature fluctuations. The latter required an epitaxially grown Nb film with a Pt capping layer to minimize detrimental oxides at all interfaces.