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Tobias Henksmeier

Tobias Henksmeier contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2021arXiv

Giant photoelasticity of polaritons for detection of coherent phonons in a superlattice with quantum sensitivity

The functionality of phonon-based quantum devices largely depends on the efficiency of interaction of phonons with other excitations. For phonon frequencies above 20 GHz, generation and detection of the phonon quanta can be monitored through photons. The photon-phonon interaction can be enormously strengthened by involving an intermediate resonant quasiparticle, e.g. an exciton, with which a photon forms a polariton. In this work, we discover a giant photoelasticity of exciton-polaritons in a short-period superlattice and exploit it for detecting propagating acoustic phonons. We demonstrate that 42 GHz coherent phonons can be detected with extremely high sensitivity in the time domain Brillouin oscillations by probing with photons in the spectral vicinity of the polariton resonance.

preprint2021arXiv

Selective etching of (111)B-oriented $Al_x Ga_{1-x} As$-layers for epitaxial lift-off

GaAs-(111)-nanostructures exhibiting second harmonic generation are new building blocks in nonlinear optics. Such structures can be fabricated through epitaxial lift-off employing selective etching of Al-containing layers and subsequent transfer to glass substrates. In this article, the selective etching of (111)B-oriented $Al_x Ga_{1-x}As$ sacrificial layers (10 nm to 50 nm thick) with different aluminum concentrations (x=0.5 to 1.0) in 10 % hydrofluoric acid is investigated and compared to standard (100)-oriented structures. The thinner the sacrificial layer and the lower the aluminum content, the lower the lateral etch rate. For both orientations, the lateral etch rates are in the same order of magnitude, but some quantitative differences exist. Furthermore, the epitaxial lift-off, the transfer, and the nano-patterning of thin (111)B-oriented GaAs membranes is demonstrated. Atomic force microscopy and high-resolution x-ray diffraction measurements reveal the high structural quality of the transferred GaAs-(111) films.