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Thomas R. Bieler

Thomas R. Bieler appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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2 published item(s)

preprint2020arXiv

Grain boundary slip transfer classification and metric selection with artificial neural networks

An artificial neural network is used to evaluate the effectiveness of six metrics and their combinations to assess whether slip transfers across grain boundaries in coarse-grained oligocrystalline Al foils \citep{Bieler_etal2019_2,Alizadeh_etal2020}. This approach extends the one- or two-dimensional projections formerly applied to analyze slip transfer. The accuracy of this binary classification reaches around \pcnt{87} for the best single metric and around \pcnt{90} when considering two or more metrics simultaneously. The results suggest slip transfer mostly depends on the geometric relationship between grains. Training a double-layer network having \num{10} nodes per hidden layer with \num{40} measurements is sufficient to render the maximum accuracy.

preprint2013arXiv

Near-Field Microwave Magnetic Nanoscopy of Superconducting Radio Frequency Cavity Materials

A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two new measurements are performed to demonstrate these capabilities with a novel near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual- Resistance-Ratio bulk Nb sample showing strong localized nonlinear response for the first time, with surface RF magnetic field $B_{surface} \sim 10^{2}$ $mT$. The second is a raster scanned harmonic response image on a high quality $MgB_{2}$ thin film demonstrating a quench defect-free surface over large areas.