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Takashi Hanada

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2 publications

preprint2022arXiv

sim-trhepd-rheed -- Open-source simulator of total-reflection high-energy positron diffraction (TRHEPD) and reflection high-energy electron diffraction (RHEED)

The present paper reports sim-trhepd-rheed (STR), an open-source simulator of total-reflection high-energy positron diffraction (TRHEPD) and reflection high-energy electron diffraction (RHEED) experiments which are used for atom-scale surface structure determination of a material. The STR simulator is used for the analysis of experimental diffraction data by simulating the rocking curve from a given trial surface structure by solving the partial differential equation of the dynamical quantum diffraction theory for positron or electron wavefunctions. Using the obtained surface structure, electronic structure, and other physical quantities can be evaluated through first-principles calculations. For this purpose, a utility software was also developed in order to realize a first principles calculation with the Quantum ESPRESSO suite.

preprint2019arXiv

Development of data-analysis software for total-reflection high-energy positron diffraction (TRHEPD)

The present paper reports on the recent activity of the data analysis software development for total-reflection high-energy positron diffraction (TRHEPD), a novel experimental technique for surface structure determination. Experiments using TRHEPD are being conducted intensively at the Slow Positron Facility, Institute of Materials Structure Science, High Energy Accelerator Research Organization, revealing surface structure of interest. The data analysis software provides a solution to the inverse problem in which the atomic positions of a surface structure are determined from the experimental diffraction data (rocking curve). The forward problem is solved by the numerical solution of the partial differential equation in the quantum scattering problem. A technical demonstration with a test problem was carried out to confirm the software functioned as expected. Since the analysis method has a general mathematical foundation, it is also applicable to other experiments, such as X-ray or electron diffraction experiments.

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