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T. Wamsat

T. Wamsat contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2012arXiv

A Study of Beam Position Diagnostics with Beam-excited Dipole Higher Order Modes using a Downconverter Test Electronics in Third Harmonic 3.9 GHz Superconducting Accelerating Cavities at FLASH

Beam-excited higher order modes (HOM) in accelerating cavities contain transverse beam position information. Previous studies have narrowed down three modal options for beam position diagnostics in the third harmonic 3.9 GHz cavities at FLASH. Localized modes in the beam pipes at approximately 4.1 GHz and in the fifth cavity dipole band at approximately 9 GHz were found, that can provide a local measurement of the beam position. In contrast, propagating modes in the first and second dipole bands between 4.2 and 5.5 GHz can reach a better resolution. All the options were assessed with a specially designed test electronics built by Fermilab. The aim is to define a mode or spectral region suitable for the HOM electronics. Two data analysis techniques are used and compared in extracting beam position information from the dipole HOMs: direct linear regression and singular value decomposition. Current experiments suggest a resolution of 50 μm accuracy in predicting local beam position using modes in the fifth dipole band, and a global resolution of 20 μm over the complete module. Based on these results we decided to build a HOM electronics for the second dipole band and the fifth dipole band, so that we will have both high resolution measurements for the whole module, and localized measurements for individual cavity. The prototype electronics is being built by Fermilab and planned to be tested in FLASH by the end of 2012.

preprint2012arXiv

Performance of a Downconverter Test-electronics with MTCA-based Digitizers for Beam Position Monitoring in 3.9 GHz Accelerating Cavities

Beam-excited higher order modes (HOM) in 3.9GHz accelerating cavities are planned to be used for beam position monitoring at the European XFEL. The selected HOMs are located around 5440MHz, with a bandwidth of 100MHz and 9060MHz, with a bandwidth of 50MHz. A downconverter electronics, built for tests at FLASH, converts the HOMs to an intermediate frequency of 70MHz. The MTCA (Micro Telecommunications Computing Architecture) standard will be used for the XFEL. Thus it is important to have a performance study of the downconverter test-electronics using the MTCA digitizer card SIS8300. In the digitizer the IF frequency of 70MHz is undersampled with a clock frequency of 108MS/s. The paper presents the performance of the digitizer together with the test-electronics. A comparison with a 216MS/s VME (Versa Module Eurocard) digitizer is made.