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Sukarno O. Ferreira

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cond-mat.stat-mech cond-mat.mtrl-sci cond-mat.soft

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preprint2011arXiv

Addendum to "Anomalous scaling and super-roughness in the growth of CdTe polycrystalline films"

The scaling of the growth of CdTe films on glass substrates was investigated by Mata \textit{et al.} [Phys. Rev. B \textbf{78}, 115305 (2008)]. Part of the analysis consisted of the estimation of the correlation length $ξ$ using the decay in the height-height correlation function. Afterwards, the dynamical exponent $z$ was determined using the scaling hypothesis $ξ\sim t^{1/z}$ . In this Addendum, we show that the correlation lengths obtained by Mata \textit{et al.} provide a long wavelength coarsening exponent that does not correspond to the dynamical exponent $z$ . We also show that the short wavelength coarsening exponent is consistent with the exponent $z$ obtained by Nascimento \textit{et al}. [arXiv:1101.1493] via generic dynamical scaling theory.

preprint2011arXiv

Anomalous scaling and super-roughness in the growth of CdTe polycrystalline films

CdTe films grown on glass substrates covered by fluorine doped tin oxide by Hot Wall Epitaxy (HWE) were studied through the interface dynamical scaling theory. Direct measures of the dynamical exponent revealed an intrinsically anomalous scaling characterized by a global roughness exponent $α$ distinct from the local one (the Hurst exponent $H$ ), previously reported [Ferreira \textit{et al}., Appl. Phys. Lett. \textbf{88}, 244103 (2006)]. A variety of scaling behaviors was obtained with varying substrate temperature. In particular, a transition from a intrinsically anomalous scaling regime with $H\neα<1$ at low temperatures to a super-rough regime with $H\neα>1$ at high temperatures was observed. The temperature is a growth parameter that controls both the interface roughness and dynamical scaling exponents. Nonlocal effects are pointed as the factors ruling the anomalous scaling behavior.

preprint2011arXiv

Faceted anomalous scaling in the epitaxial growth of semiconductor films

We apply the generic dynamical scaling theory (GDST) to the surfaces of CdTe polycrystalline films grown in glass substrates. The analysed data were obtained with a stylus profiler with an estimated resolution lateral resolution of $l_c=0.3 μ$ m. Both real two-point correlation function and power spectrum analyses were done. We found that the GDST applied to the surface power spectra foresees faceted morphology in contrast with the self-affine surface indicated by the local roughness exponent found via the height-height correlation function. This inconsistency is explained in terms of convolution effects resulting from the finite size of the probe tip used to scan the surfaces. High resolution AFM images corroborates the predictions of GDST.

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Sukarno O. Ferreira

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3 publications

Addendum to "Anomalous scaling and super-roughness in the growth of CdTe polycrystalline films"

Anomalous scaling and super-roughness in the growth of CdTe polycrystalline films

Faceted anomalous scaling in the epitaxial growth of semiconductor films

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