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Shi-Shun Chen

Shi-Shun Chen contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2026arXiv

Reliability is a new science: we are on the right way

Reliability has long been treated as an engineering practice supported by testing, statistics and standards, yet its status as a scientific discipline remains unsettled. From a philosophical perspective, scientific truth is characterized by a dual-structure that links empirical truth and mathematical truth, which requires an axiomatic system that is symbolically expressible and verifiable by universally repeatable controlled experiments. Building on this criterion, this paper examines whether reliability satisfies the dual-structure of scientific truth. Firstly, we analyze the philosophical foundations of the reliability problem, tracing its transition from experiential confidence and engineering practice toward scientific inquiry. Then, reliability science principles are introduced as an axiomatic system consisting of margin, degradation and uncertainty, which define reliability as the repeatability of system performance across time and space. Next, we present reliability science experiments as the empirical aspect of the dual-structure, where controlled and repeatable interventions are designed to verify the causal relations implied by the axioms. Furthermore, we develop the mathematical framework of reliability as the symbolic aspect of the dual-structure, articulating reliability laws through distance, relation and change, and developing a time-dependent measure, Biandong Statistics, to represent varying uncertainty beyond static descriptions. Accordingly, we argue that reliability is indeed a scientific discipline. The applicability of reliability science is demonstrated across engineering, living and social systems, and a unified logic for guiding engineering activities across the entire product lifecycle is provided, linking reliability to the conceptual, development, procurement, production and operation phases within a model-based structure.

preprint2026arXiv

Reliability Modeling of Single-Sided Aluminized Polyimide Films during Storage Considering Stress-Induced Degradation Mechanism Transition

Single-sided aluminized polyimide films (SAPF) are widely used in thermal management of aerospace systems. Although the reliability of SAPF in space environments has been thoroughly studied, its reliability in ground environments during storage is always ignored, potentially leading to system failure. This paper aims to investigate the reliability of SAPF in storage environments, focusing on the effects of temperature and relative humidity. Firstly, the relationship between the performance degradation of SAPF and aluminum corrosion is identified. Next, considering the presence of two distinct stages in the influence of temperature on aluminum corrosion, a novel degradation model accounting for the degradation mechanism transition is developed. Additionally, a parameter analysis method is proposed for determining SAPF degradation mechanism based on experimental data. Then, a statistical analysis method incorporating an improved rime optimization algorithm is employed for parameter estimation, and the reliability model is established. Experimental results demonstrate that the proposed method effectively identifies two distinct stages in the impact of temperature on SAPF performance degradation. Furthermore, the proposed degradation model outperforms traditional degradation models with unchanged degradation mechanism in terms of degradation prediction accuracy, extrapolation capability and robustness, indicating its suitability for describing the degradation pattern of SAPFs.