Researcher profile

Sean Breckling

Sean Breckling contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2025arXiv

Single-View Tomographic Reconstruction Using Learned Primal Dual

The Learned Primal Dual (LPD) method has shown promising results in various tomographic reconstruction modalities, particularly under challenging acquisition restrictions such as limited viewing angles or a limited number of views. We investigate the performance of LPD in a more extreme case: single-view tomographic reconstructions of axially-symmetric targets. This study considers two modalities: the first assumes low-divergence or parallel X-rays. The second models a cone-beam X-ray imaging testbed. For both modalities, training data is generated using closed-form integral transforms, or physics-based ray-tracing software, then corrupted with blur and noise. Our results are then compared against common numerical inversion methodologies.

preprint2020arXiv

Methods to Quantify Dislocation Behavior with Dark-field X-ray Microscopy Timescans of Single-Crystal Aluminum

Crystal defects play a large role in how materials respond to their surroundings, yet there are many uncertainties in how extended defects form, move, and interact deep beneath a material's surface. A newly developed imaging diagnostic, dark-field X-ray microscopy (DFXM) can now visualize the behavior of line defects, known as dislocations, in materials under varying conditions. DFXM images visualize dislocations by imaging the very subtle long-range distortions in the material's crystal lattice, which produce a characteristic adjoined pair of bright and dark regions. Full analysis of how these dislocations evolve can be used to refine material models, however, it requires quantitative characterization of the statistics of their shape, position and motion. In this paper, we present a semi-automated approach to effectively isolate, track, and quantify the behavior of dislocations as composite objects. This analysis drives the statistical characterization of the defects, to include dislocation velocity and orientation in the crystal, for example, and is demonstrated on DFXM images measuring the evolution of defects at 98$\%$ of the melting temperature for single-crystal aluminum, collected at the European Synchrotron Radiation Facility.