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S. I. Bozhko

S. I. Bozhko contributes to research discovery and scholarly infrastructure.

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cond-mat.mes-hall cond-mat.mtrl-sci

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preprint2020arXiv

Memory effect in the charge transport in strongly disordered antimony films

We study conductivity of strongly disordered amorphous antimony films under high bias voltages. We observe non-linear current-voltage characteristic, where the conductivity value at zero bias is one of two distinct values, being determined by the sign of previously applied voltage. Relaxation curves demonstrate high stability of these conductivity values on a large timescale. Investigations of the antimony film structure allows to determine the percolation character of electron transport in strongly disordered films. We connect the memory effect in conductivity with modification of the percolation pattern due to recharging of some film regions at high bias voltages.

preprint2014arXiv

Surface states in a 3D topological insulator: The role of hexagonal warping and curvature

We explore a combined effect of hexagonal warping and of finite effective mass on both the tunneling density of electronic states (TDOS) and structure of Landau levels (LLs) of 3D topological insulators. We find the increasing warping to transform the square-root van Hove singularity into a logarithmic one. For moderate warping an additional logarithmic singularity and a jump in the TDOS appear. This phenomenon is experimentally verified by direct measurements of the local TDOS in Bi$_2$Te$_3$. By combining the perturbation theory and the WKB approximation we calculate the LLs in the presence of hexagonal warping. We predict that due to the degeneracy removal the evolution of LLs in the magnetic field is drastically modified.

preprint2011arXiv

Structure and magnetic properties of nanostructured Pd-Fe thin films produced by pulse electrodeposition

Nanostructured Pd-Fe thin films with varied Fe content were prepared by electrodeposition technique from organic electrolytes on Cu and brass substrates. The structure and the magnetic properties of the films were investigated prior to post-deposition annealing. The structure of the Pd1-xFex thin films with x = 0.14, 0.24, and 0.52 was determined by X-ray diffraction (XRD) and transmission electron microscopy (TEM) as a solid solution of iron in palladium face-centered cubic lattice with the (111) orientation of nanograins relatively to the substrate surface. The films with higher iron concentration, x = 0.74, 0.91, have structure of a solid solution based on the body-centered cubic lattice. The average grain size determined by the scanning electron microscopy (SEM) for the first two alloys is 7-10 nm, and for the latter ones it is about 120 nm. The saturation magnetization of the films has linear dependence on the iron content, but coercivity has non-monotonic dependence on x, i.e. the films with x = 0.68 show highest coercivity. The magnetic anisotropy of the samples is studied by ferromagnetic resonance (FMR) spectroscopy.