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Roger Proksch

Roger Proksch appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mes-hallcond-mat.mtrl-sci

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Published work

6 published item(s)

preprint2026arXiv

Hidden dynamics in fast force curves: Transient Damping and Brownian-Driven Contact Resonance

Force distance curves (FCs) are among the most direct measurements performed in atomic force microscopy (AFM), yet their information content is often reduced by filtering and quasi-static interpretation. Here, enabled by a new interferometric detector, we show that fast FCs inherently excite short-lived cantilever oscillations whose transient frequency and decay encode local stiffness and dissipation. By analyzing these dynamics on a single-curve, single-pixel basis, we extract time-local mechanical information without external broadband excitation or multi-pass imaging. We develop a state-dependent single-mode harmonic oscillator model that captures snap-in excitation, hydration-mediated dissipation, and contact stiffness during fast force mapping. Experimental analysis of high-bandwidth force-curve data and numerical simulations demonstrate that multiple dynamically distinct interaction regimes occur within a single FC. Accessing these transient dynamics enables high-throughput, high-resolution mapping of mechanical contrast and reveals heterogeneous and non-repeatable behaviors that are lost under conventional averaging or with conventional detection schemes with higher noise floors.

0 citations0 reviewsNo code linkedOpen access
preprint2016arXiv

Calibration of higher eigenmodes of cantilevers

A method is presented for calibrating the higher eigenmodes (resonance modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine the power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonance frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for three popular multifrequency cantilevers. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

In-situ Piezoresponse Force Microscopy Cantilever Mode Shape Profiling

The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate (PPLN) sample. One notable conclusion is that a common choice of OBD spot location, at or near the tip of the cantilever is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Quantitative Measurements of Electromechanical Response with a Metrological Atomic Force Microscope

An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy (PFM). As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity, a longstanding goal in the electromechanical community.

0 citations0 reviewsNo code linkedOpen access
preprint2014arXiv

Electrochemical Strain Microscopy of Silica Glasses

Piezoresponse Force Microscopy (PFM) and Electrochemical Strain Microscopy (ESM) are two related techniques that have had considerable success in nano-scale probing of functional material properties. Both measure the strain of the sample in response to a localized electric field beneath a sharp conductive tip. In this work, a collection of commercially available glass samples were measured with a variety of Si cantilevers coated with different conductive metals. In some cases, these glasses showed significant hysteresis loops, similar in appearance to those measured on ferroelectric materials with spontaneous permanent electric dipoles. The magnitude of the electrochemical strain and hysteresis correlated well with the molar percentage of sodium in the glass material, with high sodium (soda-lime) glass showing large hysteresis and fused silica (pure SiO2) showing essentially no hysteresis. The elephant-ear shape of the hysteresis loops correlated well with it originating from relaxation behavior, an interpretation verified by observing the temperature dependent relaxation of the ESM response. Cation mobility in a disordered glass should have a low diffusion constant. To evaluate this diffusion constant, the temperature of the glass was varied between room temperature and 200C. Vanishing hysteresis as the temperature increased was associated with a decrease in the relaxation time of the electrochemical response. The hysteretic behavior changed drastically in this temperature range, consistent with bound surface water playing a large role in the relaxation. This demonstrates the ability of ESM to differentiate cationic concentrations in a range of silica glasses. In addition, since glass is a common sample substrate for, this provides some clear guidance for avoiding unwanted substrate crosstalk effects in piezoresponse and electrochemical strain response measurements.

0 citations0 reviewsNo code linkedOpen access
preprint2014arXiv

Photothermally Excited Contact Resonance Imaging in Air and Water

Contact Resonance Force Microscopy (CR-FM) is a leading AFM technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the "forest of peaks" frequency response associated with acoustic excitation methods effectively masks the true cantilever resonance. Using photothermal actuation results in clean contact resonance spectra, that closely match the ideal frequency response of the cantilever, allowing unambiguous and simple resonance frequency and quality factor measurements in air and liquids alike. This extends the capabilities of CR-FM to biologically relevant and other soft samples in liquid environments. We demonstrate CR-FM in air and water on both stiff silicon/titanium samples and softer polystyrene-polyethylene-polypropylene polymer samples with the quantitative moduli having very good agreement between expected and measured in both environments.

0 citations0 reviewsNo code linkedOpen access