Researcher profile

Robert F. Harrison

Robert F. Harrison contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Information Theoretic Data Injection Attacks with Sparsity Constraints

Information theoretic sparse attacks that minimize simultaneously the information obtained by the operator and the probability of detection are studied in a Bayesian state estimation setting. The attack construction is formulated as an optimization problem that aims to minimize the mutual information between the state variables and the observations while guaranteeing the stealth of the attack. Stealth is described in terms of the Kullback-Leibler (KL) divergence between the distributions of the observations under attack and without attack. To overcome the difficulty posed by the combinatorial nature of a sparse attack construction, the attack case in which only one sensor is compromised is analytically solved first. The insight generated in this case is then used to propose a greedy algorithm that constructs random sparse attacks. The performance of the proposed attack is evaluated in the IEEE 30 Bus Test Case.

preprint2022arXiv

Power Injection Measurements are more Vulnerable to Data Integrity Attacks than Power Flow Measurements

A novel metric that describes the vulnerability of the measurements in power system to data integrity attacks is proposed. The new metric, coined vulnerability index (VuIx), leverages information theoretic measures to assess the attack effect on the fundamental limits of the disruption and detection tradeoff. The result of computing the VuIx of the measurements in the system yields an ordering of the measurements vulnerability based on the level of exposure to data integrity attacks. This new framework is used to assess the measurements vulnerability of IEEE test systems and it is observed that power injection measurements are overwhelmingly more vulnerable to data integrity attacks than power flow measurements. A detailed numerical evaluation of the VuIx values for IEEE test systems is provided.