Researcher profile

Riley J. Preston

Riley J. Preston contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2023arXiv

Emergence of negative viscosities and colored noise under current-driven Ehrenfest molecular dynamics

Molecules in molecular junctions are subject to current-induced forces that can break chemical bonds, induce reactions, destabilize molecular geometry, and halt the operation of the junction. Theories behind current-driven molecular dynamics simulations rely on a perturbative time-scale separation within the system with subsequent use of nonequilibrium Green's functions (NEGF) to compute conservative, non-conservative, and stochastic forces exerted by electrons on nuclear degrees of freedom. We analyze the effectiveness of this approximation, paying particular attention to the phenomenon of negative viscosities. The perturbative approximation is directly compared to the nonequilibrium Ehrenfest approach. We introduce a novel time-stepping approach to calculate the forces present in the Ehrenfest method via exact integration of the equations of motion for the nonequilibrium Green's functions, which does not necessitate a time-scale separation within the system and provides an exact description for the corresponding classical dynamics. We observe that negative viscosities are not artifacts of a perturbative treatment but also emerge in Ehrenfest dynamics. However, the effects of negative viscosity have the possibility of being overwhelmed by the predominantly positive dissipation due to the higher-order forces unaccounted for by the perturbative approach. Additionally, we assess the validity of the white-noise approximation for the stochastic forces, finding that it is justifiable in the presence of a clear time-scale separation and is more applicable when the current-carrying molecular orbital is moved outside of the voltage window. Finally, we demonstrate the method for molecular junction models consisting of one and two classical degrees of freedom.

preprint2020arXiv

Current-induced atomic motion, structural instabilities, and negative temperatures on molecule-electrode interfaces in electronic junctions

Molecule-electrode interfaces in molecular electronic junctions are prone to chemical reactions, structural changes, and localized heating effects caused by electric current. These can be exploited for device functionality or may be degrading processes that limit performance and device lifetime. We develop a nonequilibrium Green's function based transport theory in which the central region atoms and, more importantly, atoms on molecule-electrode interfaces are allowed to move. The separation of time-scales of slow nuclear motion and fast electronic dynamics enables the algebraic solution of the Kadanoff-Baym equations in the Wigner space. As a result, analytical expressions for dynamical corrections to the adiabatically computed Green's functions are produced. These dynamical corrections depend not only on the instantaneous molecular geometry but also on the nuclear velocities. To make the theoretical approach fully self-consistent, the same time-separation approach is used to develop expressions for the adiabatic, dissipative, and stochastic components of current-induced forces in terms of adiabatic Green's functions. Using these current induced forces, the equation of motion for the nuclear degrees of freedom is cast in the form of a Langevin equation. The theory is applied to model molecular electronic junctions. We observe that the interplay between the value of the spring constant for the molecule-electrode chemical bond and electronic coupling strength to the corresponding electrode is critical for the appearance of structural instabilities and, consequently, telegraphic switching in the electric current. The range of model parameters is identified to observe structurally stable molecular junctions as well as various different kinds of current-induced telegraphic switching. The interfacial structural instabilities are also quantified based on current noise calculations.