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Ranko Heindl

Ranko Heindl contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2012arXiv

Switching Distributions for Perpendicular Spin-Torque Devices within the Macrospin Approximation

We model "soft" error rates for writing (WSER) and for reading (RSER) for perpendicular spin-torque memory devices by solving the Fokker-Planck equation for the probability distribution of the angle that the free layer magnetization makes with the normal to the plane of the film. We obtain: (1) an exact, closed form, analytical expression for the zero-temperature switching time as a function of initial angle; (2) an approximate analytical expression for the exponential decay of the WSER as a function of the time the current is applied; (3) comparison of the approximate analytical expression for the WSER to numerical solutions of the Fokker-Planck equation; (4) an approximate analytical expression for the linear increase in RSER with current applied for reading; (5) comparison of the approximate analytical formula for the RSER to the numerical solution of the Fokker-Planck equation; and (6) confirmation of the accuracy of the Fokker-Planck solutions by comparison with results of direct simulation using the single-macrospin Landau-Lifshitz-Gilbert (LLG) equations with a random fluctuating field in the short-time regime for which the latter is practical.

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preprint2011arXiv

Thermal Relaxation Rates of Magnetic Nanoparticles in the Presence of Magnetic Fields and Spin-Transfer Effects

We have measured the relaxation time of a thermally unstable ferromagnetic nanoparticle incorporated into a magnetic tunnel junction (MTJ) as a function of applied magnetic field, voltage V (-0.38 V < V < +0.26 V), and temperatures (283 K< T< 363 K) . By analyzing the results within the framework of a modified Néel-Brown formalism we determine the effective attempt time of the nanoparticle and also the bias dependences of the in-plane and out-of-plane spin torques. There is a significant linear modification of the effective temperature with voltage due to the in-plane torque and a significant contribution of a &#34;field like&#34; torque that is quadratic with voltage. The methods presented here do not require complicated models for device heating or calibration procedures, but instead directly measure how temperature, field, and voltage influence the energy landscape and thermal fluctuations of a two-state system. These results should have significant implications for designs of future nanometer-scale magnetic random access memory elements and provide a straightforward methodology to determine these parameters in other MTJ device structures.

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