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Ran Eshel

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2 published item(s)

preprint2019arXiv

Non-uniform electro-osmotic flow drives fluid-structure instability

We demonstrate the existence of a fluid-structure instability arising from the interaction of electro-osmotic flow with an elastic substrate. Considering the case of flow within a soft fluidic chamber, we show that above a certain electric field threshold, negative gauge pressure induced by electro-osmotic flow causes the collapse of its elastic walls. We combine experiments and theoretical analysis to elucidate the underlying mechanism for instability and identify several distinct dynamic regimes. The understanding of this instability is important for the design of electrokinetic systems containing soft elements.

preprint2019arXiv

Revisiting, resolving and unifying the nanochannel-microchannel electrical resistance paradigm

Until recently, the accepted paradigm was that the Ohmic electrical response of nanochannel-microchannel systems is determined solely by the nanochannel while the effects of the adjacent microchannels are negligible. Two, almost identical, models were suggested to rationalize experimental observations that appeared to confirm the paradigm. However, recent works have challenged this paradigm and shown that the microchannels contribute in a non-negligible manner, and thus these two models are inadequate in describing realistic nanochannel-microchannel systems. Two newer nanochannel-microchannel models were suggested to replace the nanochannel-dominant models. These models were limited to either very low or very high concentrations. Here, we review these four leading models. The most popular is shown to be incorrect, while the remaining models are unified under a newly derived solution which shows remarkable correspondence to simulations and experiments. The unifying model can be used to improve the design of any nanofluidic based systems as the physics are more transparent, and the need for complicated time-consuming preliminary simulations and experiments has been eliminated.