Researcher profile

Raghvendra S. Saxena

Raghvendra S. Saxena contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate

Trust snapshot

Quick read

Trust 13 - Baseline
2works
0followers
1topics
1close collaborators

Actions

Decide how to stay connected

Follow researcher0

Research graph

See the researcher in context

Open full explorer

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2010arXiv

A New Strained-Silicon Channel Trench-gate Power MOSFET: Design and Analysis

In this paper, we propose a new trench power MOSFET with strained Si channel that provides lower on resistance than the conventional trench MOSFET. Using a 20% Ge mole fraction in the Si1-xGex body with a compositionally graded Si1-xGex buffer in the drift region enables us to create strain in the channel along with graded strain in the accumulation region. As a result, the proposed structure exhibits 40% enhancement in current drivability, 28% reduction in the on-resistance and 72% improvement in peak transconductance at the cost of only 12% reduction in the breakdown voltage when compared to the conventional trench gate MOSFET. Furthermore, the graded strained accumulation region supports the confinement of carriers near the trench sidewalls improving the field distribution in the mesa structure useful for a better damage immunity during inductive switching.

preprint2010arXiv

A Stepped Oxide Hetero-Material Gate Trench Power MOSFET for Improved Performance

In this work, we propose a new Stepped Oxide Hetero-Material Trench (SOHMT) power MOSFET with three sections in the trench gate (an N+ poly gate sandwiched between two P+ poly gates) and having different gate oxide thicknesses (increasing from source side to drain side). The different gate oxide thickness serves the purpose of simultaneously achieving (i) a good gate control on the channel charge and (ii) a lesser gate to drain capacitance. As a result, we obtain higher transconductance as well as reduced switching delays, making the proposed device suitable for both RF amplification and high speed switching applications. In addition, the sandwiched gate with different work function gate materials modifies the electric field profile in the channel resulting in an improved breakdown voltage. Using two-dimensional simulations, we have shown that the proposed device structure exhibits about 32% enhancement in breakdown voltage, 25% reduction in switching delays, 20% enhancement in peak transconductance and 10% reduction in figure of merit (product of ON-resistance and gate charge) as compared to the conventional trench gate MOSFET.