Researcher profile

R. D.

R. D. contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking

Integrated circuits (ICs) are the foundation of all computing systems. They comprise high-value hardware intellectual property (IP) that are at risk of piracy, reverse-engineering, and modifications while making their way through the geographically-distributed IC supply chain. On the frontier of hardware security are various design-for-trust techniques that claim to protect designs from untrusted entities across the design flow. Logic locking is one technique that promises protection from the gamut of threats in IC manufacturing. In this work, we perform a critical review of logic locking techniques in the literature, and expose several shortcomings. Taking inspiration from other cybersecurity competitions, we devise a community-led benchmarking exercise to address the evaluation deficiencies. In reflecting on this process, we shed new light on deficiencies in evaluation of logic locking and reveal important future directions. The lessons learned can guide future endeavors in other areas of hardware security.

preprint2007arXiv

Specification Test Compaction for Analog Circuits and MEMS

Testing a non-digital integrated system against all of its specifications can be quite expensive due to the elaborate test application and measurement setup required. We propose to eliminate redundant tests by employing e-SVM based statistical learning. Application of the proposed methodology to an operational amplifier and a MEMS accelerometer reveal that redundant tests can be statistically identified from a complete set of specification-based tests with negligible error. Specifically, after eliminating five of eleven specification-based tests for an operational amplifier, the defect escape and yield loss is small at 0.6% and 0.9%, respectively. For the accelerometer, defect escape of 0.2% and yield loss of 0.1% occurs when the hot and colt tests are eliminated. For the accelerometer, this level of Compaction would reduce test cost by more than half.