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Researcher profile

Philipp Hönicke

Philipp Hönicke contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.app-phphysics.atom-phcond-mat.mtrl-sci

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Published work

6 published item(s)

preprint2022arXiv

Experimental determination of the gadolinium L subshells fluorescence yields and Coster-Kronig transition probabilities

The L subshell Coster Kronig (CK) transition factors of Gd have been experimentally determined by means of two different experimental approaches and compared to available literature data. On the one hand reference-free X-ray fluorescence (XRF) analysis using an energy-dispersive detector was applied. This method permitted in addition to determine the L subshell fluorescence yields since the absolute incident and emitted X-ray photon flux can be determined. On the other hand a wavelength dispersive spectrometer based on a modified von Hamos geometry using a full cylinder highly annealed pyrolithic graphite crystal for an experimental validation of the CK transition factors in an independent experiment. The use of this high energy resolution spectrometer allowed thanks to the capability to better discriminate the different X-ray emission lines to validate the reference-free XRF results. For both experiments the use of calibrated instrumentation enabled the provision a reliable uncertainty budget on the results obtained.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Grazing incidence-X-ray fluorescence for a dimensional and elemental characterization of well-ordered nanostructures

The increasing importance of well-controlled ordered nanostructures on surfaces represents a challenge for existing metrology techniques. To develop such nanostructures and monitor complex processing constraints fabrication, both a dimensional reconstruction of nanostructures and a characterization (ideally a quantitative characterization) of their composition is required. In this work, we present a soft X-ray fluorescence-based methodology that allows both of these requirements to be addressed at the same time. By applying the grazing-incidence X-ray fluorescence technique and thus utilizing the X-ray standing wave field effect, nanostructures can be investigated with a high sensitivity with respect to their dimensional and compositional characteristics. By varying the incident angles of the exciting radiation, element-sensitive fluorescence radiation is emitted from different regions inside the nanoobjects. By applying an adequate modeling scheme, these datasets can be used to determine the nanostructure characteristics. We demonstrate these capabilities by performing an element-sensitive reconstruction of a lamellar grating made of Si$_3$N$_4$, where GIXRF data for the O-K$α$ and N-K$α$ fluorescence emission allows a thin oxide layer to be reconstructed on the surface of the grating structure. In addition, we employ the technique also to three dimensional nanostructures and derive both dimensional and compositional parameters in a quantitative manner.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Interaction of nanoparticle properties and X-ray analytical techniques

In this work, Pt-Ti core-shell nanoparticles (NP) of 2 nm to 3 nm in size and 30000 u \pm 1500 u as specified single particle mass, deposited on flat silicon substrates by means of a mass-selected cluster beam source, were used for the investigation of the modification of the X-Ray Standing Wave (XSW) field intensity with increasing NP surface coverage. The focus of the investigation is on the determination of the range of validity of the undisturbed flat surface approach of the XSW intensity in dependence of the actual coverage rate of the surface. Therefore, the nanoparticles were characterized using reference-free grazing incidence X-ray fluorescence analysis (GIXRF) employing radiometrically calibrated instrumentation. In addition, near-edge X-ray absorption fine structure (NEXAFS) measurements were performed to investigate the binding state of titanium in the core-shell nanoparticles which was found to be amorphous TiO2. The combination of GIXRF measurements and of the calculated XSW field intensities allow for a quantification of the core-shell nanoparticle surface coverage. For six different samples, the peak surface coverage could be determined to vary from 7 % to 130 % of a complete monolayer-equivalent coverage. A result of the current investigation is that core-shell nanoparticles modify the intensity distribution of the XSW field with increasing surface coverage. This experimental result is in line with calculated XSW field intensity distributions at different surface coverages using an effective density approach.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Speciation of FeS and FeS$_2$ by means of X-ray Emission Spectroscopy using a compact full-cylinder von Hamos spectrometer

We present Fe K$β$ X-ray emission (XES) and Fe K X-ray absorption spectra (XAS) of Iron(II)sulfide (FeS) and Iron(II)disulfide (FeS$_2$). While XES and XAS offer different discrimination capabilities for chemical speciation, depending on the valence states of the compounds probed, XES allows for using different excitation sources. The XES data was measured using polychromatic X-ray radiation with a full-cylinder von Hamos spectrometer being characterized by an energy window of up to 700 eV and a spectral resolving power of $E/ ΔE = 800$. The large energy window at a single position of the spectrometer components is made profit of to circumvent the instrumental sensitivity of wavelength-dispersive spectrometers to sample positioning. This results in a robust energy scale which is used to compare experimental data with ab initio valence-to-core calculations, which are carried out using the OCEAN package. To validate the reliability of the OCEAN package for the two sample systems, near edge X-ray absorption fine structure measurements of the Fe K absorption edge are compared to theory using the same input parameters as in the case of the X-ray emission calculations. Based on the example of iron sulfide compounds, the combination of XES experiments and OCEAN calculations allows unravelling the electronic structure of different transition metal sulfides and qualifying XES investigations for the speciation of different compounds.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Experimental determination of line energies, line widths and relative transition probabilities of the Gadolinium L X-ray emission spectrum

In this work the complete L-emission spectrum of gadolinium with respect to line energies, natural line widths, and relative transition probabilities was investigated using monochromatized synchrotron radiation. The measurements were realized in the PTB laboratory at BESSY II by means of an in-house built von Hamos spectrometer based on up to two full-cylinder HAPG mosaic crystal. The von Hamos spectrometer is calibrated by means of elastically scattered photons from the employed synchrotron radiation beamline leading to a well-defined energy scale and an experimentally determined spectrometer response. A selective excitation of the gadolinium L subshells was carried out to ensure a robust deconvolution of neighboring emission lines of different L subshells. The experimental results are discussed in the context of existing data from common databases and published values since significant deviations, especially for the L$γ_2$ and L$γ_3$ emission lines, are observed. We further substantiate and discuss two satellite lines at the low-energy side of the L$β_{2,15}$ and L$γ_1$ emission lines arising from the N$_{4,5}$ subshell.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Reference-free GIXRF-XRR as a methodology for independent validation of XRR on ultrathin layer stacks and a depth-dependent characterization

Nanolayer stacks are technologically very relevant for current and future applications in many fields of research. A non-destructive characterization of such systems is often performed using X-ray reflectometry (XRR). For complex stacks of multiple layers, low electron density contrast materials or very thin layers without any pronounced angular minima, this requires a full modeling of the XRR data. As such modeling is using the thicknesses, the densities and the roughnesses of each layer as parameters, this approach quickly results in a large number of free parameters. In consquence, cross-correlation effects or interparameter dependencies can falsify the modeling results. Here, we present a route for validation of such modeling results which is based on the reference-free grazing incidence X-ray fluorescence (GIXRF) methodology. In conjunction with the radiometrically calibrated instrumentation of the Physikalisch-Technische Bundesanstalt the method allows for reference-free quantification of the elemental mass depositions. In addition, a modeling approach of reference-free GIXRF-XRR data is presented, which takes advantage of the quantifiable elemental mass depositions by distributing them depth dependently. This approach allows for a reduction of the free model parameters. Both the validation capabilities and the combined reference-free GIXRF-XRR modeling are demonstrated using several nanoscale layer stacks consisting of HfO$_2$ and Al$_2$O$_3$ layers.

0 citations0 reviewsNo code linkedOpen access