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Patrick M. Birchall

Patrick M. Birchall appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

2 published item(s)

preprint2019arXiv

Quantum Optical Metrology of Correlated Phase and Loss

Optical absorption measurements characterize a wide variety of systems from atomic gases to \emph{in-vivo} diagnostics of living organisms. Here we study the potential of non-classical techniques to reduce statistical noise below the shot-noise limit in absorption measurements with concomitant phase shifts imparted by a sample. We consider both cases where there is a known relationship between absorption and a phase shift, and where this relationship is unknown. For each case we derive the fundamental limit and provide a practical strategy to reduce statistical noise. Furthermore, we find an intuitive correspondence between measurements of absorption and of lossy phase shifts, which both show the same scope for precision enhancement. Our results demonstrate that non-classical techniques can aid real-world tasks with present-day laboratory techniques.

preprint2016arXiv

Beating the Shot-Noise Limit with Sources of Partially-Distinguishable Photons

Quantum metrology promises high-precision measurements beyond the capability of any classical techniques, and has the potential to be integral to investigative techniques. However, all sensors must tolerate imperfections if they are to be practical. Here we show that photons with perfectly overlapped modes, which are therefore fully indistinguishable, are not required for quantum-enhanced measurement, and that partially-distinguishable photons do not have to be engineered to mitigate the adverse effects of distinguishability. We quantify the effect of distinguishability on quantum metrology experiments, and report results of an experiment to verify that two- and four-photon states containing partially-distinguishable photons can achieve quantum-enhanced sensitivity with low-visibility quantum interference. This demonstrates that sources producing photons with mixed spectral states can be readily utilized for quantum metrology.