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P. Lupo

P. Lupo contributes to research discovery and scholarly infrastructure.

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cond-mat.mtrl-sci cond-mat.mes-hall

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preprint2016arXiv

Electrical Switching of Magnetization in Films of alpha-Iron with Naturally Hydroxidized Surface

Control of the magnetization vector in ferromagnetic films and heterostructures by using electric tools instead of external magnetic fields can lead to low-power memory devices. We observe the robust changes in magnetization states of a thin (about 30 nm) film of alpha-Fe covered by the naturally formed layer ( about 6 nm in thickness) of iron ohyhydroxides (FeOOH) under discharging a capacitor through the film. Strikingly, the magnetization vector is switchable by the discharge even with no any biasing field at room temperatures. In this electrically induced magnetization switching (EIMS) we reveal the key role of the FeOOH layer. We demonstrate experimental evidences that not the discharge current itself but the electric field (of the order of 10 kV/m) generated by this current is responsible for EIMS. The results reported here provide a plausible explanation of the observed phenomenon in terms of electric-field-induced weak ferromagnetism in the FeOOH layer and its coupling with the underlying alpha-Fe.

preprint2015arXiv

Evidence for In-Plane Tetragonal c-axis in Mn$_x$Ga$_{1-x}$ Thin Films using Transmission Electron Microscopy

Tetragonal Mn$_x$Ga$_{1-x}$ (x=0.70, 0.75) thin films grown on SrTiO$_3$ substrates at different temperatures and thicknesses exhibit perpendicular magnetic anisotropy with coercive fields between 1-2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40nm samples grown at 300-350$^{o}$C lead to polycrystalline films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in a secondary magnetic component in the out of plane magnetization. Growth at 300$^{o}$C with a reduced thickness or Mn concentration significantly decreases the presence of the tetragonal c-axis in the film plane, thus improving the magnetic properties. TEM is of critical importance in characterizing these materials, since conventional XRD cannot always identify the presence of additional crystallographic orientations although they can still affect the magnetic properties. Our study points to ways that the microstructure of these thin films can be controlled, which is critical for utilization of this material in spintronic devices.

preprint2010arXiv

Interface effects on an ultrathin Co film in multilayers based on the organic semiconductor Alq3

The effect of the AlOx barrier thickness on magnetic and morphological properties of Ta/Co/(AlOx)/Alq3/Si hybrid structures was systematically studied by means of atomic force microscopy, SQUID magnetometry and nuclear magnetic resonance (NMR). All used techniques pointed out that the barrier thickness of 2 nm is required to obtain a magnetically good cobalt layer on top of Alq3. 59Co NMR measurements revealed that the AlOx barrier gives rise to the formation of an interface layer with "defective" cobalt favouring growth of "bulk" cobalt with good magnetic properties.