BZPEERPapers, people, evidence and research pathsDiscover
Research tools
Network
Opportunities
Account
Source author record
P. G. Spizzirri appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.
Catalog footprint
Research graph
Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.
BZPEER is loading the nearby papers, people, topics and institutions for this page.
Published work
Electrically detected magnetic resonance (EDMR) is applied to mm size devices with implanted leads and a 50 micron square gap laid down on bulk phosphorus doped silicon. Devices with a range of phosphorus concentrations and surface types were prepared and measured to examine the interplay between donor and charge trap states in producing EDMR signals.
Near-field enhanced, nano-Raman spectroscopy has been successfully used to probe the surface chemistry of silicon prepared using standard wafer cleaning and processing techniques. The results demonstrate the utility of this measurement for probing the local surface chemical nano-environment with very high sensitivity. Enhancements were observed for the vibrational (stretching) modes of Si-H, F-Si-H and possibly also B-O-Si consistent with the surface treatments applied. The nano-probes did not enhance the phononic features of the silicon substrate.