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Oleg Soloviev

Oleg Soloviev appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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3 published item(s)

preprint2020arXiv

Convex combination of alternating projection and Douglas-Rachford operators for phase retrieval

We present the convergence analysis of convex combination of the alternating projection and Douglas-Rachford operators for solving the phase retrieval problem. New convergence criteria for iterations generated by the algorithm are established by applying various schemes of numerical analysis and exploring both physical and mathematical characteristics of the phase retrieval problem. Numerical results demonstrate the advantages of the algorithm over the other widely known projection methods in practically relevant simulations.

preprint2019arXiv

Alias-Free Basis for Modal Sensorless Adaptive Optics Using the Second Moment of Intensity

In theory of optical aberrations, an aberrated wavefront is represented by its coefficients in some orthogonal basis, for instance by Zernike polynomials. However, many wavefront measurement techniques implicitly approximate the gradient of the wavefront by the gradients of the basis functions. For a finite number of approximation terms, the transition from a basis to its gradient might introduce an aliasing error. To simplify the measurements, another set of functions, an "optimal basis" with orthogonal gradients, is often introduced, for instance Lukosz-Braat polynomials. The article first shows that such bases do not necessarily eliminate the aliasing error and secondly considers the problem of finding an alias-free basis on example of second-moment based indirect wavefront sensing methods. It demonstrates that for these methods any alias-free basis should be formed by functions simultaneously orthogonal in two dot-products and be composed of the eigenfunctions of the Laplace operator. The fitness of such alias-free basis for optical applications is analysed by means of numerical simulations on typical aberrations occurring in microscopy and astronomy.