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Nathalie Brun

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cond-mat.mtrl-sci Computer Vision eess.IV physics.app-ph physics.data-an

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preprint2020arXiv

Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling

This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature for many imaging modalities, but only a few attempts handled 3D data such as spectral images acquired by STEM electron energy loss spectroscopy (EELS). Besides, among the methods proposed in the microscopy literature, some are fast but inaccurate while others provide accurate reconstruction but at the price of a high computation burden. Thus none of the proposed reconstruction methods fulfills our expectations in terms of accuracy and computation complexity. In this paper, we propose a fast and accurate reconstruction method suited for atomic-scale EELS. This method is compared to popular solutions such as beta process factor analysis (BPFA) which is used for the first time on STEM-EELS images. Experiments based on real as synthetic data will be conducted.

preprint2019arXiv

Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns

The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron dose effects. In this work, we present the implementation of a random scan operating mode in STEM achieved at the hardware level via a custom scan control module. A pre-defined pattern with fully shuffled raster order is used to sample the entire region of interest. Subsampled random sparse images can then be extracted at successive time frames, to which suitable image reconstruction techniques can be applied. With respect to the conventional raster scan mode, this method permits to limit dose accumulation effects, but also to decouple the spatial and temporal information in hyperspectral images. We provide some proofs of concept of the flexibility of the random scan operating mode, presenting examples of its applications in different spectro-microscopy contexts: atomically-resolved elemental maps with electron energy loss spectroscopy and nanoscale-cathodoluminescence spectrum images. By employing adapted post-processing tools, it is demonstrated that the method allows to precisely track and correct for sample instabilities and to follow spectral diffusion with a high spatial localization.

preprint2012arXiv

Spectral mixture analysis of EELS spectrum-images

Recent advances in detectors and computer science have enabled the acquisition and the processing of multidimensional datasets, in particular in the field of spectral imaging. Benefiting from these new developments, earth scientists try to recover the reflectance spectra of macroscopic materials (e.g., water, grass, mineral types...) present in an observed scene and to estimate their respective proportions in each mixed pixel of the acquired image. This task is usually referred to as spectral mixture analysis or spectral unmixing (SU). SU aims at decomposing the measured pixel spectrum into a collection of constituent spectra, called endmembers, and a set of corresponding fractions (abundances) that indicate the proportion of each endmember present in the pixel. Similarly, when processing spectrum-images, microscopists usually try to map elemental, physical and chemical state information of a given material. This paper reports how a SU algorithm dedicated to remote sensing hyperspectral images can be successfully applied to analyze spectrum-image resulting from electron energy-loss spectroscopy (EELS). SU generally overcomes standard limitations inherent to other multivariate statistical analysis methods, such as principal component analysis (PCA) or independent component analysis (ICA), that have been previously used to analyze EELS maps. Indeed, ICA and PCA may perform poorly for linear spectral mixture analysis due to the strong dependence between the abundances of the different materials. One example is presented here to demonstrate the potential of this technique for EELS analysis.