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N. U. Bhajantri contributes to research discovery and scholarly infrastructure.
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Published work
In this paper, we propose a machine vision algorithm for automatically detecting defects in patterned textures with the help of gradient space and its energy. Experiments on real fabric images with defects show that the proposed method can be used for automatic detection of fabric defects in textile industries.
Periodicity of a texture is one of the important visual characteristics and is often used as a measure for textural discrimination at the structural level. Knowledge about periodicity of a texture is very essential in the field of texture synthesis and texture compression and also in the design of frieze and wall papers. In this paper, we propose a method of periodicity extraction from noisy images based on superposition of distance matching function (DMF) and wavelet decomposition without de-noising the test images. Overall DMFs are subjected to single-level Haar wavelet decomposition to obtain approximate and detailed coefficients. Extracted coefficients help in determination of periodicities in row and column directions. We illustrate the usefulness and the effectiveness of the proposed method in a texture synthesis application.
In this paper, we propose a machine vision algorithm for automatically detecting defects in textures belonging to 16 out of 17 wallpaper groups using texture-periodicity and a family of Gabor wavelets. Input defective images are subjected to Gabor wavelet transformation in multi-scales and multi-orientations and a resultant image is obtained in L2 norm. The resultant image is split into several periodic blocks and energy of each block is used as a feature space to automatically identify defective and defect-free blocks using Ward's hierarchical clustering. Experiments on defective fabric images of three major wallpaper groups, namely, pmm, p2 and p4m, show that the proposed method is robust in finding fabric defects without human intervention and can be used for automatic defect detection in fabric industries.
Chi-square histogram distance is one of the distance measures that can be used to find dissimilarity between two histograms. Motivated by the fact that texture discrimination by human vision system is based on second-order statistics, we make use of histogram of gray-level co-occurrence matrix (GLCM) that is based on second-order statistics and propose a new machine vision algorithm for automatic defect detection on patterned textures. Input defective images are split into several periodic blocks and GLCMs are computed after quantizing the gray levels from 0-255 to 0-63 to keep the size of GLCM compact and to reduce computation time. Dissimilarity matrix derived from chi-square distances of the GLCMs is subjected to hierarchical clustering to automatically identify defective and defect-free blocks. Effectiveness of the proposed method is demonstrated through experiments on defective real-fabric images of 2 major wallpaper groups (pmm and p4m groups).