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Marina Manganaro

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Published work

2 published item(s)

preprint2016arXiv

Issues related to the usage of nitrogen as carrier gas for the MOVPE growth of GaSb/InAs heterostructures on InAs pseudosubstrates

GaSb/InAs/GaSb layer stacks have been grown on InAs metamorphic substrates (pseudosubstrates) by MOVPE, using nitrogen as major carrier gas. We demonstrate that GaSb growth by nitrogen MOVPE on InAs metamorphic substrates (and on InAs wafers) is possible in a very narrow range of growth parameters. As demonstrators, GaSb/InAs/GaSb structures were grown for electron mobility tests, obtaining (unintentional) 2D electron gas densities in the order of 9/5x10e12 cm(e-2) and mobilities up to 1.2/1.8x10e4 cm(e2)/Vs at room and liquid nitrogen temperature respectively. We show that it is beneficial to have some hydrogen in the carrier gas mixture for GaSb growth to achieve good crystal quality, morphology and electrical properties. Furthermore, an unexpected and previously unreported decomposition process of GaSb is observed at relatively low growth temperatures under the supply of the precursors for InAs epitaxial overgrowth. This nevertheless gets suppressed at even lower growth temperatures.

preprint2015arXiv

Evaluation of defect density by top-view large scale AFM on metamorphic structures grown by MOVPE

We demonstrate an atomic force microscopy based method for estimation of defect density by identification of threading dislocations on a non-flat surface resulting from metamorphic growth. The discussed technique can be applied as an everyday evaluation tool for the quality of epitaxial structures and allow for cost reduction, as it lessens the amount of the transmission electron microscopy analysis required at the early stages of projects. Metamorphic structures with low surface defectivities (below 106) were developed successfully with the application of the technique, proving its usefulness in process optimisation.