Researcher profile

M. Ramm

M. Ramm contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2014arXiv

Local Detection of Quantum Correlations with a Single Trapped Ion

As one of the most striking features of quantum mechanics, quantum correlations are at the heart of quantum information science. Detection of correlations usually requires access to all the correlated subsystems. However, in many realistic scenarios this is not feasible since only some of the subsystems can be controlled and measured. Such cases can be treated as open quantum systems interacting with an inaccessible environment. Initial system-environment correlations play a fundamental role for the dynamics of open quantum systems. Following a recent proposal, we exploit the impact of the correlations on the open-system dynamics to detect system-environment quantum correlations without accessing the environment. We use two degrees of freedom of a trapped ion to model an open system and its environment. The present method does not require any assumptions about the environment, the interaction or the initial state and therefore provides a versatile tool for the study of quantum systems.

preprint2013arXiv

Probing surface electric field noise with a single ion

We report room-temperature electric field noise measurements combined with in-situ surface characterization and cleaning of a microfabricated ion trap. We used a single-ion electric field noise sensor in combination with surface cleaning and analysis tools, to investigate the relationship between electric field noise from metal surfaces in vacuum and the composition of the surface. These experiments were performed in a novel setup that integrates ion trapping capabilities with surface analysis tools. We find that surface cleaning of an aluminum-copper surface significantly reduces the level of electric field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The post-cleaning noise levels are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap.