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M. Oriunno

M. Oriunno contributes to research discovery and scholarly infrastructure.

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Published work

5 published item(s)

preprint2019arXiv

Measurements of electron transport in liquid and gas Xenon using a laser-driven photocathode

Measurements of electron drift properties in liquid and gaseous xenon are reported. The electrons are generated by the photoelectric effect in a semi-transparent gold photocathode driven in transmission mode with a pulsed ultraviolet laser. The charges drift and diffuse in a small chamber at various electric fields and a fixed drift distance of 2.0 cm. At an electric field of 0.5 kV/cm, the measured drift velocities and corresponding temperature coefficients respectively are $1.97 \pm 0.04$ mm/$μ$s and $(-0.69\pm0.05)$\%/K for liquid xenon, and $1.42 \pm 0.03$ mm/$μ$s and $(+0.11\pm0.01)$\%/K for gaseous xenon at 1.5 bar. In addition, we measure longitudinal diffusion coefficients of $25.7 \pm 4.6$ cm$^2$/s and $149 \pm 23$ cm$^2$/s, for liquid and gas, respectively. The quantum efficiency of the gold photocathode is studied at the photon energy of 4.73 eV in liquid and gaseous xenon, and vacuum. These charge transport properties and the behavior of photocathodes in a xenon environment are important in designing and calibrating future large scale noble liquid detectors.

preprint2019arXiv

Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths

Characterization of the vacuum ultraviolet (VUV) reflectance of silicon photomultipliers (SiPMs) is important for large-scale SiPM-based photodetector systems. We report the angular dependence of the specular reflectance in a vacuum of SiPMs manufactured by Fondazionc Bruno Kessler (FBK) and Hamamatsu Photonics K.K. (HPK) over wavelengths ranging from 120 nm to 280 nm. Refractive index and extinction coefficient of the thin silicon-dioxide film deposited on the surface of the FBK SiPMs are derived from reflectance data of a FBK silicon wafer with the same deposited oxide film as SiPMs. The diffuse reflectance of SiPMs is also measured at 193 nm. We use the VUV spectral dependence of the optical constants to predict the reflectance of the FBK silicon wafer and FBK SiPMs in liquid xenon.

preprint2019arXiv

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in Liquid Xenon

Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE. Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 micrometer micro-cells conducted with xenon scintillation light (~175 nm) in liquid xenon. The specular reflectivity at 15 deg. incidence of three samples of VUV4 SiPMs is found to be 30.4+/-1.4%, 28.6+/-1.3%, and 28.0+/-1.3%, respectively. The PDE at normal incidence differs by +/-8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.

preprint2018arXiv

Elastic differential cross-section ${\rm d}σ/{\rm d}t$ at $\sqrt{s}=$2.76 TeV and implications on the existence of a colourless 3-gluon bound state

The proton-proton elastic differential cross section ${\rm d}σ/{\rm d}t$ has been measured by the TOTEM experiment at $\sqrt{s}=2.76$ TeV energy with $β^{*}=11$ m beam optics. The Roman Pots were inserted to 13 times the transverse beam size from the beam, which allowed to measure the differential cross-section of elastic scattering in a range of the squared four-momentum transfer ($|t|$) from $0.36$ GeV$^{2}$ to $0.74$ GeV$^{2}$. The differential cross-section can be described with an exponential in the $|t|$-range between $0.36$ GeV$^{2}$ and $0.54$ GeV$^{2}$, followed by a diffractive minimum (dip) at $|t_{\rm dip}| = 0.61 \pm 0.03$ GeV$^{2}$ and a subsequent maximum (bump). The ratio of the ${\rm d}σ/{\rm d}t$ at the bump and at the dip is $1.7\pm 0.2$. When compared to the $\rm p\bar{p}$ measurement of the D0 experiment at $\sqrt s = 1.96$ TeV, a significant difference can be observed. Under the condition that the effects due to the energy difference between TOTEM and D0 can be neglected, the result provides evidence for a colourless 3-gluon bound state exchange in the $t$-channel of the proton-proton elastic scattering.

preprint2018arXiv

Elastic differential cross-section measurement at $\sqrt{s}=13$ TeV by TOTEM

The TOTEM collaboration has measured the elastic proton-proton differential cross section ${\rm d}σ/{\rm d}t$ at $\sqrt{s}=13$ TeV LHC energy using dedicated $β^{*}=90$ m beam optics. The Roman Pot detectors were inserted to 10$σ$ distance from the LHC beam, which allowed the measurement of the range $[0.04$ GeV$^{2}$$; 4 $GeV$^{2}$$]$ in four-momentum transfer squared $|t|$. The efficient data acquisition allowed to collect about 10$^{9}$ elastic events to precisely measure the differential cross-section including the diffractive minimum (dip), the subsequent maximum (bump) and the large-$|t|$ tail. The average nuclear slope has been found to be $B=(20.40 \pm 0.002^{\rm stat} \pm 0.01^{\rm syst})~$GeV$^{-2}$ in the $|t|$-range $0.04~$GeV$^{2}$ to $0.2~$GeV$^{2}$. The dip position is $|t_{\rm dip}|=(0.47 \pm 0.004^{\rm stat} \pm 0.01^{\rm syst})~$GeV$^{2}$. The differential cross section ratio at the bump vs. at the dip $R=1.77\pm0.01^{\rm stat}$ has been measured with high precision. The series of TOTEM elastic pp measurements show that the dip is a permanent feature of the pp differential cross-section at the TeV scale.