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M. Maier

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physics.acc-ph hep-ex nucl-ex

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preprint2020arXiv

Refining the evaluation of eigen-emittances measured by the dedicated four-dimensional emittance scanner ROSE

A dedicated device to fully determine the four-dimensional beam matrix, called ROSE (ROtating System for Emittance measurements) was successfully commissioned. Results obtained with 83Kr13+ at 1.4 MeV/u are reported in Phys. Rev. Accel. Beams 19, 072802 (2016). Coupled moments were determined with an accuracy of about 10%, which is sufficiently low to reliably determine a lattice which could decouple the beam. However, the remaining uncertainty on the corresponding eigen emittances was still considerable high. The present paper reports on improvement of the evaluation procedure which lowers the inaccuracy of measured eigen emittances significantly to the percent level. The method is based on trimming directly measured data within their intrinsic measurement resolution such that the finally resulting quantity is determined with high precision.

preprint2016arXiv

Rotating system for four-dimensional transverse rms-emittance measurements

Knowledge of the transverse four-dimensional beam rms-parameters is essential for applications that involve lattice elements that couple the two transverse degrees of freedom (planes). Of special interest is the removal of inter-plane correlations to reduce the projected emittances. A dedicated ROtating System for Emittance measurements (ROSE) has been proposed, developed, and successfully commissioned to fully determine the four-dimensional beam matrix. This device has been used at the High Charge injector (HLI) at GSI using a beam line which is composed of a skew quadrupole triplet, a normal quadrupole doublet, and ROSE. Mathematical algorithms, measurements, and results for ion beams of 83Kr13+ at 1.4 MeV/u are reported in this paper.

preprint2014arXiv

Experimental Proof of Adjustable Single-Knob Ion Beam Emittance Partitioning

The performance of accelerators profits from phase space tailoring by coupling of planes. The previously applied techniques swap the emittances among the three planes but the set of available emittances is fixed. In contrast to these emittance exchange scenarios the emittance transfer scenario presented here allows for arbitrarily changing the set of emittances as long as the product of the emittances is preserved. This letter is on the first experimental demonstration of transverse emittance transfer along an ion beam line. The amount of transfer is chosen by setting just one single magnetic field value. The envelope-functions (beta) and -slopes (alpha) of the finally uncorrelated and re-partitioned beam at the exit of the transfer line do not depend on the amount of transfer.

preprint2012arXiv

Preparation of an emittance transfer experiment

Flat beams feature unequal emittances in the horizontal and vertical phase space. Those beams were created successfully in lepton machines. Although a number of applications will profit also from flat hadron beams, to our knowledge they have never been created systematically. Multi-turn injection schemes, spectrometers, and colliders will directly benefit from those beams. The present paper covers the preparation of the experimental proof of principle for flat hadron beam creation in a beam transport section. Detailed simulations of the experiment, based on charge state stripping inside of a solenoid [L. Groening, Phys. Rev. ST Accel. Beams 14, 064201 (2011)], are performed. The matrix formalism was benchmarked with tracking through three-dimensional magnetic field maps of solenoids. An error analysis targeting at investigation of the impact of machine errors on the round-to-flat beam transformation has been performed. The remarkable flexibility of the set-up w.r.t. decoupling is addressed, as it can provide an one-knob tool to set the horizontal and vertical emittance partitioning. Finally, the status of hardware design and production is given.

preprint1996arXiv

Characterization of Solidified Gas Thin Film Targets via Alpha Particle Energy Loss

A method is reported for measuring the thickness and uniformity of thin films of solidified gas targets. The energy of alpha particles traversing the film is measured and the energy loss is converted to thickness using the stopping power. The uniformity is determined by measuring the thickness at different positions with an array of sources. Monte Carlo simulations have been performed to study the film deposition mechanism. Thickness calibrations for a TRIUMF solid hydrogen target system are presented.