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Le Guan

Le Guan appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

2 published item(s)

preprint2022arXiv

$μ$AFL: Non-intrusive Feedback-driven Fuzzing for Microcontroller Firmware

Fuzzing is one of the most effective approaches to finding software flaws. However, applying it to microcontroller firmware incurs many challenges. For example, rehosting-based solutions cannot accurately model peripheral behaviors and thus cannot be used to fuzz the corresponding driver code. In this work, we present $μ$AFL, a hardware-in-the-loop approach to fuzzing microcontroller firmware. It leverages debugging tools in existing embedded system development to construct an AFL-compatible fuzzing framework. Specifically, we use the debug dongle to bridge the fuzzing environment on the PC and the target firmware on the microcontroller device. To collect code coverage information without costly code instrumentation, $μ$AFL relies on the ARM ETM hardware debugging feature, which transparently collects the instruction trace and streams the results to the PC. However, the raw ETM data is obscure and needs enormous computing resources to recover the actual instruction flow. We therefore propose an alternative representation of code coverage, which retains the same path sensitivity as the original AFL algorithm, but can directly work on the raw ETM data without matching them with disassembled instructions. To further reduce the workload, we use the DWT hardware feature to selectively collect runtime information of interest. We evaluated $μ$AFL on two real evaluation boards from two major vendors: NXP and STMicroelectronics. With our prototype, we discovered ten zero-day bugs in the driver code shipped with the SDK of STMicroelectronics and three zero-day bugs in the SDK of NXP. Eight CVEs have been allocated for them. Considering the wide adoption of vendor SDKs in real products, our results are alarming.

preprint2020arXiv

Logic Bugs in IoT Platforms and Systems: A Review

In recent years, IoT platforms and systems have been rapidly emerging. Although IoT is a new technology, new does not mean simpler (than existing networked systems). Contrarily, the complexity (of IoT platforms and systems) is actually being increased in terms of the interactions between the physical world and cyberspace. The increased complexity indeed results in new vulnerabilities. This paper seeks to provide a review of the recently discovered logic bugs that are specific to IoT platforms and systems. In particular, 17 logic bugs and one weakness falling into seven categories of vulnerabilities are reviewed in this survey.