Researcher profile

Kees Vuik

Kees Vuik contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2020arXiv

Towards Accuracy and Scalability: Combining Isogeometric Analysis with Deflation to Obtain Scalable Convergence for the Helmholtz Equation

Finding fast yet accurate numerical solutions to the Helmholtz equation remains a challenging task. The pollution error (i.e. the discrepancy between the numerical and analytical wave number k) requires the mesh resolution to be kept fine enough to obtain accurate solutions. A recent study showed that the use of Isogeometric Analysis (IgA) for the spatial discretization significantly reduces the pollution error. However, solving the resulting linear systems by means of a direct solver remains computationally expensive when large wave numbers or multiple dimensions are considered. An alternative lies in the use of (preconditioned) Krylov subspace methods. Recently, the use of the exact Complex Shifted Laplacian Preconditioner (CSLP) with a small complex shift has shown to lead to wave number independent convergence while obtaining more accurate numerical solutions using IgA. In this paper, we propose the use of deflation techniques combined with an approximated inverse of the CSLP using a geometric multigrid method. Numerical results obtained for both one- and two-dimensional model problems, including constant and non-constant wave numbers, show scalable convergence with respect to the wave number and approximation order p of the spatial discretization. Furthermore, when kh is kept constant, the proposed approach leads to a significant reduction of the computational time compared to the use of the exact inverse of the CSLP with a small shift.

preprint2017arXiv

A Modified and Calibrated Drift-Diffusion-Reaction Model for Time-Domain Analysis of Charging Phenomena in Electron-Beam Irradiated Insulators

This paper presents an improved version of the previously proposed self-consistent drift-diffusion-reaction model correcting for non-physical behavior at longer time scales. To this end a novel boundary condition is employed that takes into account the effect of tertiary electrons and a fully dynamic trap-assisted generation-recombination mechanism is implemented. Sensitivity of the model with respect to material parameters is investigated and a calibration procedure is developed that reproduces experimental yield-energy curves for uncharged insulators. Long-time charging and yield variations are analyzed for stationary defocused and focused beams as well as moving beams dynamically scanning composite insulators.

preprint2015arXiv

Self-consistent drift-diffusion-reaction model for the electron beam interaction with dielectric samples

The charging of insulating samples degrades the quality and complicates the interpretation of images in scanning electron microscopy and is important in other applications, such as particle detectors. In this paper we analyze this nontrivial phenomenon on different time scales employing the drift-diffusion-reaction approach augmented with the trapping rate equations and a realistic semi-empirical source function describing the pulsed nature of the electron beam. We consider both the fast processes following the impact of a single primary electron, the slower dynamics resulting from the continuous bombardment of a sample, and the eventual approach to the steady-state regime.