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Researcher profile

Kasidit Toprasertpong

Kasidit Toprasertpong contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.app-phcond-mat.mtrl-scicond-mat.mes-hall

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Published work

4 published item(s)

preprint2023arXiv

Breakdown-limited endurance in HZO FeFETs: mechanism and improvement under bipolar stress

Breakdown is one of main failure mechanisms that limit write endurance of ferroelectric devices using hafnium oxide-based ferroelectric materials. In this study, we investigate the gate current and breakdown characteristics of Hf0.5Zr0.5O2/Si ferroelectric field-effect transistors (FeFETs) by using carrier separation measurements to analyze electron and hole leakage currents during time-dependent dielectric breakdown (TDDB) tests. Rapidly increasing substrate hole currents and stress-induced leakage current (SILC)-like electron currents can be observed before the breakdown of the ferroelectric gate insulator of FeFETs. This apparent degradation under voltage stress is recovered and the time-to-breakdown is significantly improved by interrupting the TDDB test with gate voltage pulses with the opposite polarity, suggesting that defect redistribution, rather than defect generation, is responsible for the trigger of hard breakdown.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Evaluation of polarization characteristics in metal/ferroelectric/semiconductor capacitors and ferroelectric field-effect transistors

In this study, we propose a measurement technique for evaluating ferroelectric polarization characteristics in ferroelectric field-effect transistors (FeFETs). Different from standard metal/ferroelectric/metal capacitors, the depletion and inversion phenomena in semiconductor substrates have to be carefully taken into account when evaluating the ferroelectric properties using fast voltage sweep as input. The non-equilibrium deep depletion is found to be the limiting factor for the accurate evaluation of ferroelectric properties in metal/ferroelectric/semiconductor capacitors. By connecting the source, drain, and substrate of the FeFET together during the polarization measurement, the deep depletion can be suppressed and the ferroelectricity of the ferroelectric gate can be accurately evaluated. The present technique is a powerful method for capturing the polarization states in FeFETs, enabling new approaches for device characterization and fundamental study, and overcomes the limitation found in the conventional polarization measurement on 2-terminal metal/ferroelectric/semiconductor capacitors.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Investigation and modeling of photocurrent collection process in multiple quantum well solar cells

Solar cells employing quantum wells can enhance the light absorption but suffer from the difficulty in photogenerated carrier extraction. Here, we analyzed the spectral response and the photocarrier collection mechanism of p-i-n multiple quantum well (MQW) solar cells using the effective-mobility model. Both the simulation and experiment results imply that the spatial profiles of electron and hole densities in MQWs play an important role in the carrier collection process. By considering the recombination increment under illumination, our findings suggest that the concept of the majority/minority carriers is important even in the intrinsic region: photogenerated electrons and holes only experience significant recombination when passing through the hole-rich and electron-rich regions, respectively. This can accurately explain the photocurrent behavior in cells with high background doping, background illumination, and different MQW positions. Based on the experimental findings, we derived analytical formulae for carrier collection efficiency, which directly show the impact of each cell parameter and can be used for the systematic cell design.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Microscopic observation of carrier-transport dynamics in quantum-structure solar cells using a time-of-flight technique

In this study, we propose a carrier time-of-flight technique to evaluate the carrier transport time across a quantum structure in an active region of solar cells. By observing the time-resolved photoluminescence signal with a quantum-well probe inserted under the quantum structure at forward bias, the carrier transport time can be efficiently determined at room temperature. The averaged drift velocity shows linear dependence on the internal field, allowing us to estimate the quantum structure as a quasi-bulk material with low effective mobility containing the information of carrier dynamics. We show that this direct and real-time observation is more sensitive to carrier transport than other conventional techniques, providing better insights into microscopic carrier transport dynamics to overcome a device design difficulty.

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