MnO(001) film growth on Ag(001) - a systematic study using NEXAFS, STM, and LEED
The film growth of MnO(001) films on Ag(001) up to film thicknesses of almost seven unit cells of MnO has been monitored using a complementary combination of near-edge X-ray absorption fine structure spectroscopy (NEXAFS), scanning tunneling microscopy (STM), and low-energy electron diffraction (LEED). The oxide films have been prepared by molecular beam epitaxy. Using NEXAFS, the identity of the Mn oxide has clearly been determined as MnO. For the initial stages of growth, oxide islands with p(21) and p(22) structures are formed, which are embedded into the substrate. For MnO coverages up to 1.5 unit cells a p(21) structure of the films is visible in STM and LEED. Further increase of the thickness leads to a phase transition of the oxide films resulting in an additional c(22) structure with a 45 rotated atomic pattern. The emerging film structures are discussed on the basis of a sublayer model of the MnO spinel unit cell. While the polarity of the island edges determines the structure of initial islands, the surface energy of thicker layers is remarkably reduced by a film restructuring.