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K. Tayabaly

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Published work

4 published item(s)

preprint2016arXiv

Computation and validation of two-dimensional PSF simulation based on physical optics

The Point Spread Function (PSF) is a key figure of merit for specifying the angular resolution of optical systems and, as the demand for higher and higher angular resolution increases, the problem of surface finishing must be taken seriously even in optical telescopes. From the optical design of the instrument, reliable ray-tracing routines allow computing and display of the PSF based on geometrical optics. However, such an approach does not directly account for the scattering caused by surface microroughness, which is interferential in nature. Although the scattering effect can be separately modeled, its inclusion in the ray-tracing routine requires assumptions that are difficult to verify. In that context, a purely physical optics approach is more appropriate as it remains valid regardless of the shape and size of the defects appearing on the optical surface. Such a computation, when performed in two-dimensional consideration, is memory and time consuming because it requires one to process a surface map with a few micron resolution, and the situation becomes even more complicated in case of optical systems characterized by more than one reflection. Fortunately, the computation is significantly simplified in far-field configuration, since the computation involves only a sequence of Fourier Transforms. In this paper, we provide validation of the PSF simulation with Physical Optics approach through comparison with real PSF measurement data in the case of ASTRI-SST M1 hexagonal segments. These results represent a first foundation stone for future development in a more advanced computation taking into account microroughness and multiple reflection in optical systems.

preprint2016arXiv

Testing multilayer-coated polarizing mirrors for the LAMP soft X-ray telescope

The LAMP (Lightweight Asymmetry and Magnetism Probe) X-ray telescope is a mission concept to measure the polarization of X-ray astronomical sources at 250 eV via imaging mirrors that reflect at incidence angles near the polarization angle, i.e., 45 deg. Hence, it will require the adoption of multilayer coatings with a few nanometers d-spacing in order to enhance the reflectivity. The nickel electroforming technology has already been successfully used to fabricate the high angular resolution imaging mirrors of the X-ray telescopes SAX, XMM-Newton, and Swift/XRT. We are investigating this consolidated technology as a possible technique to manufacture focusing mirrors for LAMP. Although the very good reflectivity performances of this kind of mirrors were already demonstrated in grazing incidence, the reflectivity and the scattering properties have not been tested directly at the unusually large angle of 45 deg. Other possible substrates are represented by thin glass foils or silicon wafers. In this paper we present the results of the X-ray reflectivity campaign performed at the BEAR beamline of Elettra - Sincrotrone Trieste on multilayer coatings of various composition (Cr/C, Co/C), deposited with different sputtering parameters on nickel, silicon, and glass substrates, using polarized X-rays in the spectral range 240 - 290 eV.