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Researcher profile

John Sinsheimer

John Sinsheimer contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-scimath.NTmath.PRphysics.app-ph

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Published work

3 published item(s)

preprint2019arXiv

Quantum efficiency enhancement of bialkali photocathodes by an atomically thin layer on substrates

We report quantum efficiency (QE) enhancements in accelerator technology relevant antimonide photocathodes (K2CsSb) by interfacing them with atomically thin two-dimensional (2D) crystal layers. The enhancement occurs in a reflection mode, when a 2D crystal is placed in between the photocathodes and optically reflective substrates. Specifically, the peak QE at 405 nm (3.1 eV) increases by a relative 10 percent, while the long wavelength response at 633 nm (2.0 eV) increases by a relative 36 percent on average and up to 80 percent at localized hot spot regions when photocathodes are deposited onto graphene coated stainless steel. There is a similar effect for photocathodes deposited on hexagonal boron nitride monolayer coatings using nickel substrates. The enhancement does not occur when reflective substrates are replaced with optically transparent sapphire. Optical transmission, X-ray diffraction (XRD) and X-ray fluorescence (XRF) revealed that thickness, crystal orientation, quality and elemental stoichiometry of photocathodes do not appreciably change due to 2D crystal coatings. These results suggest optical interactions are responsible for the QE enhancements when 2D crystal sublayers are present on reflective substrates, and provide a pathway toward a simple method of QE enhancement in semiconductor photocathodes by an atomically thin 2D crystal on substrates.

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preprint2015arXiv

In-situ x-ray diffraction and the evolution of polarization during the growth of ferroelectric superlattices

In epitaxially strained ferroelectric thin films and superlattices, the ferroelectric transition temperature can lie above the growth temperature. Ferroelectric polarization and domains should then evolve during the growth of a sample, and electrostatic boundary conditions may play an important role. In this work, ferroelectric domains, surface termination, average lattice parameter and bilayer thickness are simultaneously monitored using in-situ synchrotron x-ray diffraction during the growth of BaTiO$_3$/SrTiO$_3$ superlattices on SrTiO$_3$ substrates by off-axis RF magnetron sputtering. The technique used allows for scan times substantially faster than the growth of a single layer of material. Effects of electric boundary conditions are investigated by growing the same superlattice alternatively on SrTiO$_3$ substrates and 20nm SrRuO$_3$ thin films on SrTiO$_3$ substrates. These experiments provide important insights into the formation and evolution of ferroelectric domains when the sample is ferroelectric during the growth process.

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preprint2006arXiv

Distribution of Eigenvalues of Real Symmetric Palindromic Toeplitz Matrices and Circulant Matrices

Consider the ensemble of real symmetric Toeplitz matrices, each independent entry an i.i.d. random variable chosen from a fixed probability distribution p of mean 0, variance 1, and finite higher moments. Previous investigations showed that the limiting spectral measure (the density of normalized eigenvalues) converges weakly and almost surely, independent of p, to a distribution which is almost the standard Gaussian. The deviations from Gaussian behavior can be interpreted as arising from obstructions to solutions of Diophantine equations. We show that these obstructions vanish if instead one considers real symmetric palindromic Toeplitz matrices, matrices where the first row is a palindrome. A similar result was previously proved for a related circulant ensemble through an analysis of the explicit formulas for eigenvalues. By Cauchy's interlacing property and the rank inequality, this ensemble has the same limiting spectral distribution as the palindromic Toeplitz matrices; a consequence of combining the two approaches is a version of the almost sure Central Limit Theorem. Thus our analysis of these Diophantine equations provides an alternate technique for proving limiting spectral measures for certain ensembles of circulant matrices.

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