The Validity Window of Space-Charge-Limited Current Measurements of Metal Halide Perovskite Devices
Space-charge-limited current (SCLC) measurements are used to estimate charge carrier mobilities and electronic trap densities of semiconductors by analysing the current density-voltage (JV) relationship for unipolar devices predicted by the Mott-Gurney (MG) law. However, the interpretation of SCLC measurements for metal-halide perovskites is problematic due to mobile ionic defects which redistribute to screen electrostatic fields in devices during measurements. To overcome this, an SCLC measurement protocol was recently suggested that minimises ionic charge redistribution by probing the current during millisecond voltage pulses superimposed on a background bias. Here, we use drift-diffusion simulations with mobile ions to assess the validity of the MG law for analysing both the standard and new protocol JV measurements. We simulated idealised perovskite devices with differing mobile ion densities and compared them with simulations and measurements of devices with typical contact materials. We found the validity region for the MG law is limited to perovskites with mobile ion densities lower than the device's equilibrium charge carrier density (<10^17 cm-3 for 400 nm thick methylammonium lead iodide films) and contacts with injection/extraction barriers <=0.1 eV. The latter limitation can be partially overcome by increasing the device thickness, whereas the former limitation cannot. This restricts the range of perovskite layer compositions and viable contact materials that can be reliably analysed with the MG law. Approaches such as estimating trap densities from the apparent voltage onset to trap-free SCLC regime should also be critically reviewed since they rely on the same potentially invalid assumptions as the MG law. Our results demonstrate that extracting meaningful and accurate values for metal halide perovskite material properties from SCLC maybe challenging, or often not possible.