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João Elias Figueiredo Soares Rodrigues

João Elias Figueiredo Soares Rodrigues appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

3 published item(s)

preprint2013arXiv

Ordering and phonons in Ba$_3$CaNb$_{2}$O$_9$ complex perovskite

In this work we performed a detailed investigation about ordering in \bcn perovskite. The sintering temperature and time were changed to obtain samples with different ordering. The order parameters were probed by Raman spectroscopy based on a partial disordered model. To use the partial disordered model correctly we performed {\it ab initio} calculations in \bcn to assign the optical phonons. The results showed that sintering temperature improves order while sintering time is not so efficient to promote order.

preprint2013arXiv

Synthesis and structural ordering of nano-sized Ba3B'Nb2O9 (B'= Ca and Zn) powders

In this work we investigated the phase formation and structural ordering of Ba$_{3}$B$^{'}$Nb$_{2}$O$_{9}$ (B$^{'}$ $=$ Ca and Zn) perovskite powders obtained by a modified polymeric precursor route using X-ray powder diffraction and Raman spectroscopy. We obtained single phase complex perovskites at 900 $^o$C. Williamson-Hall analysis and scanning electron microscopy showed that the powders have crystallites and particles of nanometric size.

preprint2012arXiv

Ba(Zn1/3Nb2/3)O3 thin films obtained by polymeric precursors method

In this work Ba(Zn1/3Nb2/3)O3_3$ thin films were prepared by the polymeric precursors method. A detailed description of the procedure to obtain the precursors and deposition was presented. High quality polycrystalline films of Ba(Zn1/3Nb2/3)O3 were obtained from Pt/Ti/SiO$_2$/Si substrate deposited by spin coating technique. X ray measurements show that the film crystallizes in a partial ordered trigonal structure characteristic of the 1:2 complex perovskites. The partial order and structure was confirmed by Raman measurements. Also, confocal Raman and atomic force microscopy was used to characterize the film morphology.